菅原研究室

国際会議

2010 2009 2008 2007～

2010

18th International Colloquium on Scanning Probe Microscopy
(ICSPM18)
December　Atagawa, Japan

Poster Presentation

"Force Field Spectroscopy on Oxidized Cu(110) Surface with Atomic Force Microscopy"
Y. Kinoshita, Y. Naitoh, Y.J. Li and Y. Sugawara

"Simultaneous Measurement of Tunneling Current and Force Using Low Temperature Noncontact AFM/STM"
Z.M. Ma, Y. Naitoh, Y.J. Li and Y. Sugawara

"Nanoparticle Gold Distribution on the TiO₂ Surface"
L.L. Kou, Y. Naitoh, Y.J. Li and Y. Sugawara

THIRD INTERNATIONAL SYMPOSIUM ON ATOMICALLY CONTROLLED FABRICATION TECHNOLOGY
November　Osaka University Nakanoshima Center, Osaka, Japan

Oral Presentation

"Simultaneous measurement of surface topography and elasticity at　atomic scale by multifrequency FM-AFM"
Y. Naitoh, Y. Kinoshita, Y. J. Li, and Y. Sugawara

"Force Spectroscopy Measurements on Cu(110)-O Surface with Low Temperature Atomic Force Microscopy"
Y. Kinoshita,T. Satoh, Y. Naitoh, Y.J. Li and Y. Sugawara

"Atomic Resolution of Cu(110)-O Dependence of Tip Apex Using LT-NC-AFM"
Z. Ma, Y. Naitoh, Y.J. Li and Y. Sugawara

Poster Presentation

"Force Spectroscopy Measurements on Cu(110)-O Surface with Low Temperature Atomic Force Microscopy"
Y. Kinoshita,T. Satoh, Y. Naitoh, Y.J. Li and Y. Sugawara

"Atomic Resolution of Cu(110)-O Dependence of Tip Apex Using LT-NC-AFM"
Z. Ma, Y. Naitoh, Y.J. Li and Y. Sugawara

"Force Mapping on NaCl(100)/Cu(111) Surface at 78K by Atomic Force Microscopy"
L. L. Kou, K. Tenjin, Y. Naitoh, Y.J. Li and Y. Sugawara

5th PARC Symposium: Photonics in Asia
September　Shima Kanko Hotel, Mie, Japan

Poster Presentation

"Two-dimensional Force Spectroscopy on Cu(110)-O surface"
Y. Sugawara

Osaka University- Augsburg University of Applied Sciences Scientific Workshop
August&September　Osaka University, Japan

Oral Presentation

"Atom Manipulation and Force Spectroscopy on Cu(110)-O surface with Noncontact Atomic Force Microscopy"
Y. Naitoh, Y. Kinoshita, Y. J. Li, and Y. Sugawara

18th International Vacuum Congress (IVC-18)
August　Beijing, China

Oral Presentation

"Development of Multifrequency High-Speed PM-AFM in CA Mode with the capability of imaging topography, energy dissipation and elesticity in liquid"
Y. J. Li, K. Takahashi, Y. Naitoh, and Y. Sugawara

Poster Presentation

"Atomic Resolution of Mn on Cu(110)-O Surface Investigated by LT-NC-AFM"
Z. Ma, Y. Naitoh, Y.J. Li and Y. Sugawara

"Nanoparticle Gold Distribution on the TiO2 Surface"
L. L. Kou, Y. Naitoh, Y.J. Li and Y. Sugawara

13th International Conference on Non-Contact Atomic Force Microscopy
(NC-AFM 2010)
July&August　Kanazawa, Japan

Oral Presentation

"Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature Noncontact AFM"
Y. Sugawara, Y. Kinoshita, Y. Naitoh, M. Kageshima, Y. J. Li

"Force Enhancement of Phase Modulation AFM in Liquid by Q-control"
N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara

Poster Presentation

"Atomic Resolution of Mn on Cu(110)-O Surface Investigated by LT-NC-AFM"
Z. Ma, Y. Naitoh, Y. J. Li, and Y. Sugawara

"Study Force Distribution on NaCl(100)/Cu(111) surface by AFM"
Y. J. Li, K. Tenjin, Y. Naitoh, and Y. Sugawara

"Role of tip-sample interaction force in Cu atom manipulation on Cu(110)-O surface with LT-AFM."
Y. Kinoshita, Y. Naitoh, Y. J. Li, and Y. Sugawara

"Ultrathin films of NaCl on Cu(111) with AFM"
L. L. Kou, Y. Naitoh, Y. J. Li, and Y. Sugawara

"Electrostatic force spectroscopy on semiconductor surfaces using 2nd flexural mode of cantilever oscillation"
Y. Naitoh, Y. Kinoshita, Y. J. Li, and Y. Sugawara

3rd International Symposium on Next-Generation Actuators Leading Breakthroughs
January　Tokyo Institute of Technology, Tokyo, Japan

Oral Presentation

"Development of High-Speed Actuator for Scanning Probe Microscopy"
Y. Sugawara

2009

International Symposium on Watching Biomolecules in Action (WBMA'09)
December　Osaka, Japan

Poster Presentation

"Biotin-Avidin Interactions Detected by Multifrequency High-speed Atomic Force Microscopy"
K. Takahashi, Y. J. Li, T. Fujiwara, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Development of multifrequency high-speed phase-modulation atomic force microscopy in liquid"
Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Force enhancement of phase modulation atomic force microscopy using Q-control technique for high-resolution imaging in liquid"
N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Wide-band viscoelasticity analysis of single polymer chain dynamics"
M. Kageshima, S. Kurachi, T. Ogawa, Y. Naitoh, Y. J. Li, and Y. Sugawara

17th International Colloquium on Scanning Probe Microscopy (ICSPM17)
December　Atagawa, Japan

Oral Presentation

"Development of Multifrequency High-speed NC-AFM with the Capability of Simultaneous Mapping Topographic, Energy dissipation and Elasticity Images in liquids"
Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Lateral Manipulation of Cu Atoms and 2D Force Spectroscopy on Cu(110)-O Surface with Low Temperature Atomic Force Microscopy"
Y. Kinoshita, T. Satoh, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Step-Response Measurement with Magnetically-Driven AFM Cantilever"
M. Kageshima,T. Ogawa, S. Kurachi, Y. Naitoh, Y. J. Li, and Y. Sugawara

"Formation process and local structure of graphene"
S. Mammadov, Y. Naitoh, M. Kageshima, and Y. Sugawara

Poster Presentation

"Force enhancement of phase modulation atomic force microscopy using Q-control technique for high-resolution imaging in liquid"
N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara

Second International Symposium on Atomically Controlled Fabrication Technology
November　Nakanoshima Center, Osaka, Japan

Poster Presentation

"Investigation of Force Sensitivity for Atomic-Resolution Imaging by Phase Modulation Atomic Force Microscopy with Q-control in Liquid"
N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Lateral Manipulation of Cu Atoms on Cu(110)-O Surface with Low Temperature Atomic Force Microscopy"
Y. Kinoshita, T. Satoh, K. Tenjin, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Theory of Multifrequency Method in FM-AFM"
Z. Ma, Y. Naitoh, Y. J. Li, and Y. Sugawara

"Local Structure of Epitaxial Graphene Studied by Scanning Probe Microscopy"
S. Mammadov, Y. Naitoh, M. Kageshima, and Y. Sugawara

International Conference on Nanoscience and Technology, China 2009 (ChinaNANO2009)
September　Beijing, China

Oral Presentation

"Development of Multifrequency High-speed AFM with the Capability of Imaging Elasticity in Liquid"
Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

12th International Conference on Noncontact Atomic Force Microscopy
August　New Haven, CT, USA

Oral Presentation

"Atom manipulation on Cu(110)-O surface with LT-AFM"
Y. Sugawara, Y. Kinoshita, Y. J. Li, Y. Naitoh, and M. Kageshima

Poster Presentation

"Theory of Multifrequency Method in FM-AFM"
Z. Ma, Y. Naitoh, Y. J. Li, M. Kageshima, and Y. Sugawara

"Development of Multifrequency High-speed NC-AFM in Liquid"
Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Frequency-Domain and Time-Domain Analyses of Soft-Matter Dynamics Using Wide-Band Magnetic Excitation AFM"
M. Kageshima, T. Ogawa, S. Kurachi, Y. Naitoh, Y. J. Li, and Y. Sugawara

"Manipulation Mechanism of Single Cu Atoms on Cu(110)-O surface with Low temperature Non-Contact AFM"
Y. Kinoshita, T. Satoh, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Atomic scale elasticity mapping of Ge(001) surface by multifrequency FM-AFM"
Y. Naitoh, Y. Kinoshita, Y. J. Li, M. Kageshima, and Y. Sugawara

XI International Scanning Probe Microscopy Conference
June　Madrid, Spain

Oral Presentation

"Toward Transient Mesurement of Mesoscopic Soft-Matter Systems Using Wideband Magnetic Excitation AFM"
T. Ogawa, S. Kurachi, M. Kageshima, Y. Naitoh, Y. J. Li, and Y. Sugawara

Poster Presentation

"Possibility of the force sensitivity over thermal-noise-limited noise in constant amplitude mode phase modulation AFM with Q-control"
N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Development of Multifrequency High-Speed AFM with the capability of imaging topography, energy dissipation and elasticity in liquid"
Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

2nd Multifrequency AFM Conference
June　Madrid, Spain

Oral Presentation

"Development of Multifrequency High-Speed AFM with the capability of imaging topography, energy dissipation and elasticity in liquid"
Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

2008

16th International Colloquium on Scanning Probe Microscopy (ICSPM16)
December　Atagawa, Japan

Oral Presentation

"Frequency-Resolved Analysis of Mesoscopic Soft-Matter System Using AFM"
M. Kageshima, T. Chikamoto, S. Kurachi, T. Ogawa, Y. Naitoh, and Y. Sugawara

"Atom Manipulation on Cu(110)-O Surface with Low Temperature Noncontact AFM"
Y. Sugawara, S. H. Lee, Y. Naitoh, Y. J. Li, and M. Kageshima

Poster Presentation

"Multi-functional High-speed Phase Modulation AFM with Topography, Energy Dissipation and Elasticity"
Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Analysis of Higher Eigenmodes of Magnetically-driven Atomic Force Microscopy Cantilever in Liquid"
S. Kurachi, T. Ogawa, M. Kageshima, Y. Naitoh, and Y. Sugawara

"Development of Simultaneous Imaging Method of Viscoelasticity in Multifrequency High-Speed Atomic Force Microscopy"
K. Takahashi, Y. J. Li, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Local Potential Mapping Using Surface Photovoltage in Liquid"
N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Manipulation Mechanism of a Single Cu Atom on Cu(110)-O Surfaces"
Y. Kinoshita, N. Nakamura, T. Satoh, S. H. Lee, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara

"Clue to Metal-Insulator Transition of Quasi-One-Dimensional Molecular Crystal MEM(TCNQ)2 Studied with NC-AFM"
S. Sugawa, M. Kageshima, Y. Naitoh, Y. Sugawara, and T. Hasegawa

The IPR Seminar "New Approaches to Complexity of Protein Dynamics by Single Molecule　Measurements: Experiments and Theories"
December　Osaka Universuty, Osaka, Japan

Poster Presentation

"Viscoelasticity Spectrum Measurement Using Atomic Force Microscopy for Analysis of Single Polymer Chain Dynamics"
M. Kageshima, T. Chikamoto, S. Kurachi, T. Ogawa, Y. Naitoh, and Y. Sugawara

"Analysis of Higher Eigenmodes of Atomic Force Microscopy Cantilever for Single-molecule Viscoelasticity Measurement"
S. Kurachi, T. Ogawa, M. Kageshima, Y. Naitoh, and Y. Sugawara

ISSS-5
November　Waseda Universuty, Tokyo, Japan

Oral Presentation

"Atom Manipulation on Cu(110)-O Surface with Low Temperature Noncontact AFM"
Y. Sugawara, S. H. Lee, Y. Naitoh, and M. Kageshima

"Development of Multi-functional High-speed Phase Modulation AFM in Liquids"
Y. J. Li, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

11th International Conference on Noncontact Atomic Force Microscopy
September　Madrid, Spain

Oral Presentation

"Atom Manipulation on Cu(110)-O surface with Low Temperature Noncontact AFM"
Y. Sugawara, S. H. Lee, Y. Naitoh, Y. J. Li, and M. Kageshima

Poster Presentation

"NC-AFM observation of Ge(001) surface by improved cantilever with sharp tungsten tip"
Y. Naitoh, Y. Kinoshita, M. Kageshima, and Y. Sugawara

"Development of atomic force microscope with wide band magnetic excitation of cantilever in liquid"
M. Kageshima, T. Chikamoto , T. Ogawa, Y. Naitoh, and Y. Sugawara

"Development of High-speed Phase Modulation AFM in CA mode in Liquid"
Y. J. Li, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

ICN+T 2008
July　Keystone, USA

Oral Presentation

"Attractive and Repulsive Forces in Atom Manipulation Measured with Noncontact AFM"
Y. Sugawara, S. H. Lee, Y. Naitoh, Y. J. Li, and M. Kageshima

"Development of Multi-functional High-speed Phase Modulation AFM in Liquid"
Y. J. Li, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara

2007

The 10th International Conference of Noncontact Atomic Force Microscopy
(NC-AFM2007)
9月　Antalya, Turkey

Oral Presentation

"Elimination of Instabilities in Phase Shift Curves in Phase Modulation Atomic Force Microscopy in Constant Amplitude Mode"
Y. Sugawara, N. Kobayashi, M. Kawakami, Y. J. Li, Y. Naitoh, and M. Kageshima.

"Study of c(6x2) structure on highly-oxidized Cu(110) surface using non-contact atomic force microscopy"
S. Kisimito, M. Kageshima, Y. Naitoh, and Y. Sugawara.

"Developement of High-Speed Phase-Modulation AFM Capable of Simalutaneous Imaging of Topography and Energy Dissipation in Liquid"
Y. J. Li, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara.

Poster Presentation

"Analysis of Q-controlled Phase Modulation AFM"
N. Kobayashi, Y. J. Li, Y. Naitoh, M.Kageshima and Y. Sugawara.

ChinaNano2007
June 4-6, 2007, Beijing, China

"Multi-Functional High-speed Atomic Force Microscopy in Liquids"
Y. J. Li and Yasuhiro Sugawara.

2006

The 9th International Conference of Noncontact Atomic Force Microscopy
(NC-AFM2006)
７月　Kobe, Japan
Oral

"Charge Distribution Measurement on CaF2(111)/Si(111) Surface by Electrostatic Force Imaging"
H. Nomura, K. Kawasaki, N. Ozaki, T. Chikamoto, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara.

"The Origin of Anomalous Dissipation Contrast on Si(001) Surface at 5K"
Y. Sugawra, Y. J. Li, H. Nomura, Y. Naitoh and M. Kageshima.

"Influence of Surface Stress on the Phase Change in Si(001) Step Measured by NC-AFM at 5K"
Y. Naitoh, H. Nomura, Y. J. Li, M. Kageshima and Y. Sugawara.

Poster

"The Origin of p(2x1) Phase on Si(001) Surface by NC-AFM at 5K"
Y. Naitoh, H. Nomura, Y. J. Li, M. Kageshima and Y. Sugawara.

"Electrostatic Force Spectroscopy on Insulating Surface CaF2(111)/Si(111) by using NC-AFM"
K. Kawasaki, N. Ozaki, T. Chikamoto, H. Nomura, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara.

"Measuring Viscoelastic Response of Single Biomolecule under Forced Unfolding Process"
Y. Nishihara, M. Kageshima, Y. Hirata, T. Inoue, S. Kimura, Y. Naitoh and Y. Sugawara.

"Photoisomerization Based Hydrophilicity/Hydrophobicity Control of AFM Probe toward Detection of Surface Polarization"
Y. Aburaya, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara.

"High-Sensitive Phase Modulation AFM"
N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara.

International Conference on Nanoscience and Technology
(STM06)
7月　Basel, Switzerland

Poster
"High-Sensitive Phase Modulation AFM (PM-AFM)"
N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara.

The 14th International Colloquium on Scanning Probe Microscopy
December, Atagawa, Japan
Oral

"The Origin of Anomalous Dissipation Contrast on Si(001) Surface Observed with NC-AFM at 5K"
Y. Sugawara, H. Nomura, Y. Naitoh and M. Kageshima.

"Viscoelastic Responses of Single Biopolymer Investigated with Magnetically-Modulated Atomic Force Microscopy
Y. Nishihara, T. Chikamoto, M. Kageshima, Y. Hirata, T. Inoue, S. Kimura, Y. Naitoh and Y. Sugawara.

"High Sensitive Phase Modulation Atomic Force Microscopy with Q-control Technique"
N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara.

Poster

"Developement of a High-Speed Atomic Force Microscopy (AFM)"
Y. J. Li, N. Kobayashi, H. Nomura, Y. Naitoh, M. Kageshima and Y. Sugawara.

"Dissipative Force Modulation Kelvin Probe Force Microscopy Applying Doubled Frequency AC Bias Voltage"
H. Nomura, K. Kawasaki, T. Chikamoto, Y. Naitoh, M. Kageshima and Y. Sugawara.

2005

China International Conference on Nanoscience & Technology (ChinaNANO2005)
2005/6/9 Beijing, China

"Atomic Resolution Dynamic Force Microscopy in Liquids"
Y. Sugawara, K. .Fujii, Y. Naitoh and M. Kageshima.

" p(2x1) Reconstruction on Si(001) Surface at 5K Observed by NC-AFM"
Y. J. Li, Y. Naitoh M. Kageshima and Y. Sugawara.

STM05/ICSPM13
2005/7/3-7/8 Sapporo, JAPAN
Oral

"Sub-Nanometer Resolution Dynamic Force Microscopy in Liquid"
Y. Sugawara, K. Fujii, Y. Naitoh and Kageshima.

"Identification of Subsurface Atom Species Using NC-AFM"
Y. J. Li, M. Kinoshita, K. Kawasaki, Y. Naitoh, M. Kageshima and Y. Sugawara.

"Identification Mechanism of Atomic Species on Ge/Si(111)-(7x7) Surface by Using NC-AFM"
H. Nomura, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara.

"Structural Manipulation on Si(001) Surface at 5K Controlled by AFM Tip"
Y. Naitoh, N. Ozaki, Y. J. Li, M. Kageshima and Y. Sugawara.

"Atomic Force Microscopy Sensor Fabricated with Length Extensional Quartz Oscillator for Liquid Environment"
M. Kageshima, T. Mizoguchi, Y. Naitoh and Y. Sugawara.

Poster
"High Resolution AFM Imaging of Si(111)-7x7 Surface Controlling Short Range Interaction"
K. Momotani, Y. Naitoh, Y. J. Li, M. Kageshima and Y. Sugawara.

12th Annual Interaction Conference on Composites/Nano Engineering
(ICCE-12) August Tenerife, Spain

"p(2x1) reconstruction on Si(001) surface studied by NC-AFM at 5K"
Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara.

"Sub-Nanometer Resolution Dynamic Force Microscopy in Liquids"
Y. Sugawara, K. Fujii, Y. Naitoh and M. Kageshima.

8th NC-AFM 2006
August BadEssen, Germany
Oral

"Sub-Nanometer Resolution Dynamic Force Microscopy in Liquids"
Y. J. Li, K. Fujii, Y. Naitoh, M. Kageshima and Y. Sugawara.

"Identification of subsurface atom species utilizing NC-AFM"
M. Kinoshita, K. Kawasaki, Y. Naitoh, M. Kageshima and Y. Sugawara.

Poster
"Identification Mechanism of Atomic Species on Ge/Si(111)-(7x7) Surface"
H. Nomura, Y. Naitoh, Y. J. Li, M. Kageshima and Y. Sugawara.

"Quartz Sensor for Atomic Force Microscopy in Liquid Environment"
M. Kageshima, T. Mizoguchi, Y. Naitoh and Y. Sugawara.

"Development of NC-AFM operating in a magnetic field"
K. Momotani, Y. Naitoh, H. Nomura, M. Kageshima and Y. Sugawara.

2004
NCAFM04
2004/9/12-9/15 Seattle, USA
Oral

"High sensitivity Dynamic Force Microscopy in Liquids"
Y. Sugawara, K. Fujii, Y. Naitoh and M. Kageshima.

"Structure change on Si(001) surface at 5K perturbed by AFM tip"
Y. Naitoh, N. Ozaki, Y. J. Li, M. Kageshima and Y. Sugawara.

The 12th International Colloquium on Scanning Probe Microscopy
2004/12/9 Atagawa, Japan

"High sensitive dynamic force microscopy in liquids"
Y. Sugawara, K. Fujii, Y. Naitoh and M. Kageshima.

国際会議報告(菅原康弘)

1) N.Chubachi, J.Kushibiki and Y.Sugawara;
“Off-Centric Concave Transducer for Acoustic Microscopy",
Proceedings of 6th Symposium on Ultrasonic Electronics, Tokyo 1985
[Jpn.J.Appl.Phys., Vol.25, Suppl.25-1 (1986) pp.203-205].
2) Y.Sugawara, J.Kushibiki and N.Chubachi;
" Theoretical Analysis on Acoustic Fields Formed by Focusing Devices in
Acoustic Microscopy",
Proceedings of 1986 IEEE Ultrasonic Symposium,
Williamsburg, 1986, pp.783-788.
3) Y.Sugawara, J.Kushibiki and N.Chubachi;
" Performance of Concave Transducers in Acoustic Microscopy",
Proceedings of 1988 IEEE Ultrasonic Symposium,
Baltimore, 1988, pp.751-756.

4) Y.Fukano, Y.Sugawara, S.Morita, Y.Yamanishi and T.Oasa;
“Nanometer Resolution Measurement of Dielectric Breakdown of Silicon
Dioxide Films with AFM/STM",
Extended Abstracts of the 1992 International Conference on Solid State Devices
and Materials, Tsukuba, August 26-28, 1992, PA1-4, pp.117-119.

5) Y.Sugawara, Y.Fukano, S.Morita, A.Nakano and T.Ida;
“AFM/STM Investigation of pn Junctions Formed by Ion Implantation",
Extended Abstracts of the 1992 International Conference on Solid State Devices
and Materials, Tsukuba, August 26-28, 1992, PA1-L10, pp.135-136.

6) Y.Sugawara and S.Morita:
“Observation of the Surface by Using AFM/STM”,
Proceedings of the Fourth International Symposium on Advanced Nuclear
Energy Research ?Roles and Direction of Material Science in Nuclear
Technology- (JAERI-M 92-207), Mito, February 5-7, 1992, pp.354-358.

7) Y.Sugawara, M.Ohta, Y.Kamihara, S.Morita, M.Suzuki and Y.Enomoto:
“Scanning Force Microscopy in the UHV Environment",
Proceedings of the 1st. International Workshop on Microtribology (IWM)
Morioka, October 12-13, 1992, pp.239-245.

8) S.Morita, Y.Sugawara and Y.Fukano:
“Scanning Force / Tunneling Microscopy (AFM/STM)",
Abstracts of International Symposium on Intelligent Design and Synthesis of
Electronic Material Systems (IDSEM '92),
Osaka, November 4-6, 1992, Fr-08, pp.147-148.

9) Y.Sugawara, Y.Fukano, T.Uchihashi, T.Okusako, S.Morita, Y.Yamanishi and
T.Oasa:
“Time-Evolution of Contact-Eelectrified Charges on Silicon Oxide Film
Studied with AFM”,
Proceedings of the Second International Conference on Nanometer Scale
Science and Technology (NANO-II) ,
Moscow, Russia, August 2-6, 1993, pp.747-759.

10) Y.Fukano, T.Uchihashi, Y.Sugawara, Y.Yamanishi, T.Oasa and S.Morita;
“Time Evolution of Electrostatic Force Induced by Contact-Electrified Charges
on Thin Silicon Oxide Surface",
Extended Abstracts of the 1993 Int.Conf.on Solid State Devices and Materials
(SSDM '93), Makuhari Messe, Aug.29-Sept.1, 1993, pp.609-611.

11) Y.Fukano, Y.Uchihashi, T.Okusako, K.Hontani, A.Chayahara,
Y.Sugawara, Y.Yamanishi, T.Oasa and S.Morita;
“Investigation of Trapped Charges in Silicon Oxide Layer with an Atomic Force
Microscope",
Proceedings of Int. Conf. on Advanced Microelectronic Devices and Processing
(AMDP), Sendai, 1994, pp.365-370.

12) Y.Fukano, T.Okusako, T.Uchihashi, Y.Sugawara, Y.Yamanishi, T.Oasa
and S.Morita:
“Observation of Positively Charged Trap Site in Silicon Oxide Layer with
an Atomic Force Microscope",
Extended Abstracts of the 1994 International Conference on Solid State Devices
and Materials (SSDM '94), Yokohama, 1994, pp.37-39.

13) Y.Fukano, T.Uchihashi, T.Okusako, Y.Sugawara, Y.Yamanishi, T.Oasa and
S.Morita:
“Local Dielectric Breakdown of Thin Silicon Oxide by Dense Contact
Electrification”,
Extended Abstracts of the 1994 International Conference on Solid State Devices
and Materials (SSDM ‘94), Yokohama, 1994, pp.553-555.

14) T.Uchihashi, T.Okusako, T.Tsuyuguchi, Y.Sugawara, M.Igarashi, R.Kaneko
and S.Morita:
“Charge Storage by Contact Electrification on Thin SrTiO3 Film",
Extended Abstracts of the 1994 International Conference on Solid State Devices
and Materials (SSDM '94), Yokohama, 1994, pp.778-780.

15) S.Morita, M.Ohta, H.Ueyama and Y.Sugawara:
“Noncontact UHV-AFM Imaging of InP(110) Surface with Atomic Resolution”,
Abstract of the Second Japan-Russian Seminar on Semiconductor Surfaces
(JRSSS-2), Osaka, 1995, pp.20-21.

16) T.Ohta, Y.Sugawara, S.Morita and T.Okada:
“Development of 3-D Atomic Force Computer Tomography Microscope”,
Extended Abstracts of ’96 JRCAT International Symposium on Atom
Technology, Tsukuba, February 15 and 16, 1996, pp.253-256.

17) Y.Sugawara, H.Ueyama, T.Uchihashi, M.Ohta, Y.Yanase, T.Shigematsu,
M.Suzuki and S.Morita:
“True Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact
Atomic Force Microscopy”,
Material Research Society (MRS) Symposium Proceedings, Vol.442 Defects in
Electronic Materials II, Boston, Vol.442, 1997, pp.15-23 (Invited Paper).

18) S.Morita, Y.Sugawara, T.Uchihashi, H.Ueyama, M.Abe and M.Suzuki:
“Atomically-Resolved Imaging of n+-GaAs(110) Cleaved surface with Noncontact Atomic Force/Electrostatic Force Microscope ”,
Proceedings of the International Symposium on Atomic Level Characterizations for New Materials and Devices ’97, Hawaii, November 23-28, 1997, pp.193-198.

19) T.Uchihashi, M.Ashino, M.Tanigawa, Y.Sugawara and T.Okada:
“Development of Noncontact UHV-AFM for Imaging of Biological Samples”,
Extended Abstracts of ’98 JRCAT International Symposium on Atom
Technology, Tokyo, November 25,1998, pp.99-102.

20) M.Ashino, T.Uchihashi, M.Tanigawa, Y.Sugawara and T.Okada:
“Development of Noncontact UHV-AFM for Imaging of Biological Samples”,
Extended Abstracts of ’98 JRCAT International Symposium on Atom
Technology, Tokyo, November 25, 1998, pp.103-106.

21) K.Sugiyama, N.Suehira, T.Fujii, S.Watanabe, Y.Sugawara and S.Morita:
“Development of Low-Temperature Ultrahigh Vacuum Atomic Force/Scanning
Tunneling Microscope”,
Proceedings of International Symposium on Hybrid Analyses for Functional
Nanostructure, Kyoto, December 8-11, 1998, pp.189-190.

22) S.Orisaka, T.Minobe, T.Uchihashi, Y.Sugawara and S.Morita:
“Atomic Resolution Imaging of Si(111)?3??3-Ag Surface and Metallic Ag(111)
Surface by Noncontact Atomic Force Microscope”,
Proceedings of International Symposium on Hybrid Analyses for Functional
Nanostructure, Kyoto, December 8-11, 1998, pp.191-192.

23) S.Orisaka, T.Minobe, K.Makimoto, Y.Sugawara and S.Morita:
“Atomic Resolution Imaging of Al/Si(111) Surface by Noncontact Atomic Force Microscope”,
Proceedings of the 9th International Conference on Production Engineering (9th ICPE), Osaka, August 29-September 1, 1999, pp.883-886.

24) M.Ashino, T.Uchihashi, Y.Sugawara and M.Ishikawa:
“Non-contact AFM study of TiO2 surfaces for adsorption of biomolecules”,
Extended Abstracts of ’99 JRCAT International Symposium on Atom Technology, Tokyo, November 2, 1999, pp.71-74.

25) T.Uchihashi, M.Ashino, Y.Sugawara, M.Tanigawa, T.Ishida, N.Choi,
K.Yokoyama, M.Komiyama, H.Nishijima, W.Mizutani, S.Akita, Y.Nakayama, S.Morita, H.Tokumoto and M.Ishikawa:
“High resolution imaging of DNA and organic molecules using noncontact AFM in UHV”,
Extended Abstracts of ’99 JRCAT International Symposium on Atom
Technology, Tokyo, November 2,1999, pp.103-106.

26) Y.Sugawara, K.Yokoyama, T.Ochi, A.Yoshimoto and S.Morita:
“Noncontact AFM Imaging of Si(100)2?1 and Si(100)2?1:H Surfaces”,
Proceedings of the 5th International Symposium on Advanced Physical Fields,
Tsukuba, March 6-9, 2000, pp.267-268.

27) S.Morita and Y.Sugawara:
“Atomic Force Mapping and Control of Atomic Force on a Si(111)?3??3-Ag Surface Using a Noncontact Atomic Force Microscopy”,
Inst. Phys. Conf. Ser. No.165: Symposium 12 (Proceedings of the 2nd Conf. Int. Union Microbeam Analysis Societies), Hawaii, July 9-13, 2000, pp.371-372.

28) Y.Sugawara:
“Force Imaging of Optical Near Field Using Noncontact Atomic Force
Microscopy”,
Proceedings of Near-field Nano-Photonics Symposium, Tokyo,
March 21-22, 2001, pp.141-147.

29) S.Morita and Y.Sugawara:
“Mapping and control of atomic force with noncontact atomic force microscopy”,
Riken Review, No.36 (June 2001): Focused on Science and Technology
in Micro/Nano Scale, pp. 3-5.

30) S.Morita and Y.Sugawara:
“Atomically resolved imaging of semiconductor surfaces using noncontact atomic force microscopy”,
Proceedings of the 25th International Conference on the Physics of Semiconductors, Part I, Osaka 2000, pp.443-444.

31) Y.Sugawara, N.Oyabu, O.Custance, I.Yi and S.Morita:
“Atomic manipulation and identification using noncontact atomic force microscope”,
Proceedings of the 2003 JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information and Precision Equipment, Yokohama, June 16-18, 2003, pp.W-5-W-6.

32) Y. Sugawara, K. Kawasaki, Y. J. Li, Y. Naitoh and M. Kageshima:
“Identification of Subsurface Atom Species Using Noncontact AFM”,
Journal of Chinese Electron Microscopy Society, 2006 Supplement, pp.40-41, 2006.

33) Y. J. Li, H. Nomura, N. Ozaki, Y. Naitoh, M. Kageshima and Y. Sugawara:
“The tip-induced surface structure change on Si(001) surface by NC-AFM at 5K”,
Journal of Chinese Electron Microscopy Society, 2006 Supplement, pp.18-19, 2006.

34) Y. Sugawara, Y. J. Li, Y. Naitoh and M. Kageshima:
“Development of High-Speed Actuator for Scanning Probe Microscopy”,
Proceedings of the 4th Symposium on Next-Generation Actuators Leading Breakthroughs, Okinawa Convention Center, Okinawa, Japan, November 19-20, 2007, pp. 23-26.

35) Y. Sugawara, Y. J. Li, Y. Naitoh and M. Kageshima:
“Development of High-Speed Actuator for Scanning Probe Microscopy”,
Proceedings of the 2nd International Symposium on Next-Generation Actuators Leading Breakthrough, APA Hotel & Resort Tokyo Bay Makuhari, Chiba, Japan, April 17, 2008, pp.85-88. (査読無)