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21jY. Sugawara: "Structural Manipulation and Energy Dissipation on Si(001) Surface with Noncontact Atomic Force Microscopy at 5", ChinaNano2007, June 4-6, 2007, Beijing, China

20) Y.Sugawara: gAtom Manipulation and Identification Using noncontact AFMg, The 2003 JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information and Precision Equipment (IIP/ISPS Joint MIPE 2003), June 16-16, 2003, Yokohama, Japan.

19) Y.Sugawara: gAtomic Manipulation and Identification Using Noncontact AFMh, Japan-US Symposium on Tools and Metrology for NanoTechnology, January 21-24, 2003, Ithaca, USA.

18) Y.Sugawara, N.Oyabu, N.Nakata, T.Nishimoto, E.Sugitachi, I.Yi and S.Morita: gAtom Manipulation and Identification Using NC-AFMg, The 5th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2002), August 11-14, 2002, Montreal, Canada.

17) Y.Sugawara and S.Morita: gNoncontact AFM Study for Hydrogen Termination on Silicon Surfacesh, The 15th International Vacuum Congress (IVC-15), October 28 - November 2, 2001, San Francisco, California, USA.

16) Y.Sugawara, S.Imai, Y.Sano and S.Morita: gFunctional Extension of NC-AFM: Atom Identification and Manipulation g, The 4th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2001), September 2-5, 2001, Kyoto, Japan.

15) Y.Sugawara and S.Morita: gIdentification of Atom Species on Semiconductor Surfaces Using Noncontact Atomic Force Microscopy (NC-AFM)h, The 1st International Workshop on Quantum Nonplanar Nanostructures & Nanoelectronics f01 (QNNf01), July 2-4, 2001, Tsukuba, Japan.

14) Y.Sugawara: gForce Imaging of Optical Near Field Using Noncontact Atomic Force Microscopyh, The 43rd Seminar on Science and Technology, Near Field Optics Techniques, March 21-22, 2001, Tokyo, Japan.

13) Y.Sugawara, K.Yokoyama and S.Morita: gIdentification of Atom Species on Semiconductor Surface Using Noncontact AFMh, The 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2000), November 12-16, 2000, Fukuoka, Japan.

12) Y.Sugawara, K.Yokoyama and S.Morita: gIdentification of Atom Species on Semiconductor Surface Using Noncontact AFMh, The 47th International Symposium of the American Vacuum Society (AVS-47/NANO-6), October 2-6, 2000, Boston, Massachusetts, USA.

11) Y.Sugawara: gAtom Selective AFM Imaging on Si(111)?3??3-Ag Surfaceh, The International Union of Materials Research Societies -6th International Conference in Asia (IUMRS-ICA 2000), Symposium E: Scanning Probe Microscopy for Materials Characterization, July 24-26, 2000, City University of Hong Kong.

10) Y.Sugawara, K.Yokoyama and S.Morita: gApplication of NC-AFM with true atomic resolutiong, The 3rd International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2000), July 16-19, 2000, Congress Centrum Hamburg, Germany.

9) Y.Sugawara: gForce imaging of optical near field using noncontact atomic force microscopyh, The International Symposium on Optical Science, Engineering, and Instrumentation (SPIE), Near-Field Optics: Physics, Devices, and Information Processing, July 18-23, 1999, Colorado Convention Center & Marriott City Center, Denver, Colorado USA.

8) Y.Sugawara: gNoncontact AFM Images Measured on Si(111)?3??3-Ag and Ag(111) Surfacesh, The 42nd Seminar on Science and Technology, Application of Scanning Probe Techniques, February 9-10, 1999, Tsukuba, Japan.

7) Y.Sugawara: gNoncontact Atomic Force Microscopy and Spectroscopy on Si(111)-Ag Surfaceh, The 1st Harima International Conference -Frontiers of Surface Science-, December 3-6, 1998. Harima (SPring-8), Japan.

6) T.Uchihashi, T.Tsukamoto, Y.Sugawara, M.Suzuki, Y.Yanase, T.Shigematsu, and S.Morita: gImaging of chemical reactivity on an atomic scale by noncontact UHV-AFMh, The 5th International Colloquium on Scanning Tunneling Microscopy,, December 11-13,1997, Kanazawa, Japan.

5) S.Morita, Y.Sugawara, T.Uchihashi, H.Ueyama, M.Abe and M.Suzuki: gAtomically-Resolved Imaging of n+-GaAs(110) Cleaved Surface with Noncontact Atomic Force/Electrostatic Force Microscopeh, International Symposium on Atomic Level Characterizations for New Materials and Devices f97 (ALCf97), November 23-28,1997, Hawaii, USA.

4) M.Abe, Y.Sugawara and S.Morita: "Detection of Evanescent Field by Using Noncontact Mode Atomic Force Microscope", The 4th International Colloquim on Scanning Tunneling Microscopy, December 12-14, 1996, Kanazawa, Japan.

3) Y.Sugawara, H.Ueyama, T.Uchihashi, M.Ohta, Y.Yanase, T.Shigematsu, M.Suzuki and S.Morita: gTrue Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact Atomic Force Microscopyh, Materials Research Society 1996 Fall Meeting (MRS 1996) Symposium E: Defects in Electric Materials, December 2-6, 1996, Denver, USA.

2) Y.Sugawara, M.Ohta, H.Ueyama, T.Uchihashi and S.Morita: gTrue Atomic Resolution Imaging with Noncontact Atomic Force Microscopyh, The 8th International Conference on Solid Films and Surfaces (ICSFS-8), July 1-5, 1996, Osaka, Japan.

1) Y.Sugawara, M.Ohta, H.Ueyama, S.Morita, S.Ohkouchi, M.Suzuki and S.Mishima: gTrue Atomic resolution Imaging on a Compound Semiconductor Surface with Noncontact Atomic Force Microscopyh, The 3rd International Colloquim on Scanning Tunneling Microscopy, December 7-9, 1995, Kanazawa, Japan.


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