Proceedings (Yasuhiro Sugawara)

35) Y. Sugawara, Y. J. Li, Y. Naitoh and M. Kageshima:
“Development of High-Speed Actuator for Scanning Probe Microscopy”,
Proceedings of the 2nd International Symposium on Next-Generation Actuators Leading Breakthrough, APA Hotel & Resort Tokyo Bay Makuhari, Chiba, Japan, April 17, 2008, pp.85-88. (査読無)

34) Y. Sugawara, Y. J. Li, Y. Naitoh and M. Kageshima:
“Development of High-Speed Actuator for Scanning Probe Microscopy”,
Proceedings of the 4th Symposium on Next-Generation Actuators Leading Breakthroughs, Okinawa Convention Center, Okinawa, Japan, November 19-20, 2007, pp. 23-26.

33) Y. J. Li, H. Nomura, N. Ozaki, Y. Naitoh, M. Kageshima and Y. Sugawara:
“The tip-induced surface structure change on Si(001) surface by NC-AFM at 5K”,
Journal of Chinese Electron Microscopy Society, 2006 Supplement, pp.18-19, 2006.

32) Y. Sugawara, K. Kawasaki, Y. J. Li, Y. Naitoh and M. Kageshima:
“Identification of Subsurface Atom Species Using Noncontact AFM”,
Journal of Chinese Electron Microscopy Society, 2006 Supplement, pp.40-41, 2006.

31) Y.Sugawara, N.Oyabu, O.Custance, I.Yi and S.Morita:
“Atomic manipulation and identification using noncontact atomic force microscope”,
Proceedings of the 2003 JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information and Precision Equipment, Yokohama, June 16-18, 2003, pp.W-5-W-6.

30) S.Morita and Y.Sugawara:
“Atomically resolved imaging of semiconductor surfaces using noncontact atomic force microscopy”,
Proceedings of the 25th International Conference on the Physics of Semiconductors, Part I, Osaka 2000, pp.443-444.

29) S.Morita and Y.Sugawara:
“Mapping and control of atomic force with noncontact atomic force microscopy”,
Riken Review, No.36 (June 2001): Focused on Science and Technology
in Micro/Nano Scale, pp. 3-5.

28) Y.Sugawara:
“Force Imaging of Optical Near Field Using Noncontact Atomic Force
Microscopy”,
Proceedings of Near-field Nano-Photonics Symposium, Tokyo,
March 21-22, 2001, pp.141-147.

27) S.Morita and Y.Sugawara:
“Atomic Force Mapping and Control of Atomic Force on a Si(111)?3??3-Ag Surface Using a Noncontact Atomic Force Microscopy”,
Inst. Phys. Conf. Ser. No.165: Symposium 12 (Proceedings of the 2nd Conf. Int. Union Microbeam Analysis Societies), Hawaii, July 9-13, 2000, pp.371-372.

26) Y.Sugawara, K.Yokoyama, T.Ochi, A.Yoshimoto and S.Morita:
“Noncontact AFM Imaging of Si(100)2?1 and Si(100)2?1:H Surfaces”,
Proceedings of the 5th International Symposium on Advanced Physical Fields,
Tsukuba, March 6-9, 2000, pp.267-268.

25) T.Uchihashi, M.Ashino, Y.Sugawara, M.Tanigawa, T.Ishida, N.Choi,
K.Yokoyama, M.Komiyama, H.Nishijima, W.Mizutani, S.Akita, Y.Nakayama, S.Morita, H.Tokumoto and M.Ishikawa:
“High resolution imaging of DNA and organic molecules using noncontact AFM in UHV”,
Extended Abstracts of ’99 JRCAT International Symposium on Atom
Technology, Tokyo, November 2,1999, pp.103-106.

24) M.Ashino, T.Uchihashi, Y.Sugawara and M.Ishikawa:
“Non-contact AFM study of TiO2 surfaces for adsorption of biomolecules”,
Extended Abstracts of ’99 JRCAT International Symposium on Atom Technology, Tokyo, November 2, 1999, pp.71-74.

23) S.Orisaka, T.Minobe, K.Makimoto, Y.Sugawara and S.Morita:
“Atomic Resolution Imaging of Al/Si(111) Surface by Noncontact Atomic Force Microscope”,
Proceedings of the 9th International Conference on Production Engineering (9th ICPE), Osaka, August 29-September 1, 1999, pp.883-886.

22) S.Orisaka, T.Minobe, T.Uchihashi, Y.Sugawara and S.Morita:
“Atomic Resolution Imaging of Si(111)?3??3-Ag Surface and Metallic Ag(111)
Surface by Noncontact Atomic Force Microscope”,
Proceedings of International Symposium on Hybrid Analyses for Functional
Nanostructure, Kyoto, December 8-11, 1998, pp.191-192.

21) K.Sugiyama, N.Suehira, T.Fujii, S.Watanabe, Y.Sugawara and S.Morita:
“Development of Low-Temperature Ultrahigh Vacuum Atomic Force/Scanning
Tunneling Microscope”,
Proceedings of International Symposium on Hybrid Analyses for Functional
Nanostructure, Kyoto, December 8-11, 1998, pp.189-190.

20) M.Ashino, T.Uchihashi, M.Tanigawa, Y.Sugawara and T.Okada:
“Development of Noncontact UHV-AFM for Imaging of Biological Samples”,
Extended Abstracts of ’98 JRCAT International Symposium on Atom
Technology, Tokyo, November 25, 1998, pp.103-106.

19) T.Uchihashi, M.Ashino, M.Tanigawa, Y.Sugawara and T.Okada:
“Development of Noncontact UHV-AFM for Imaging of Biological Samples”,
Extended Abstracts of ’98 JRCAT International Symposium on Atom
Technology, Tokyo, November 25,1998, pp.99-102.

18) S.Morita, Y.Sugawara, T.Uchihashi, H.Ueyama, M.Abe and M.Suzuki:
“Atomically-Resolved Imaging of n+-GaAs(110) Cleaved surface with Noncontact Atomic Force/Electrostatic Force Microscope ”,
Proceedings of the International Symposium on Atomic Level Characterizations for New Materials and Devices ’97, Hawaii, November 23-28, 1997, pp.193-198.

17) Y.Sugawara, H.Ueyama, T.Uchihashi, M.Ohta, Y.Yanase, T.Shigematsu,
M.Suzuki and S.Morita:
“True Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact
Atomic Force Microscopy”,
Material Research Society (MRS) Symposium Proceedings, Vol.442 Defects in
Electronic Materials II, Boston, Vol.442, 1997, pp.15-23 (Invited Paper).

16) T.Ohta, Y.Sugawara, S.Morita and T.Okada:
“Development of 3-D Atomic Force Computer Tomography Microscope”,
Extended Abstracts of ’96 JRCAT International Symposium on Atom
Technology, Tsukuba, February 15 and 16, 1996, pp.253-256.

15) S.Morita, M.Ohta, H.Ueyama and Y.Sugawara:
“Noncontact UHV-AFM Imaging of InP(110) Surface with Atomic Resolution”,
Abstract of the Second Japan-Russian Seminar on Semiconductor Surfaces
(JRSSS-2), Osaka, 1995, pp.20-21.

14) T.Uchihashi, T.Okusako, T.Tsuyuguchi, Y.Sugawara, M.Igarashi, R.Kaneko
and S.Morita:
“Charge Storage by Contact Electrification on Thin SrTiO3 Film",
Extended Abstracts of the 1994 International Conference on Solid State Devices
and Materials (SSDM '94), Yokohama, 1994, pp.778-780.

13) Y.Fukano, T.Uchihashi, T.Okusako, Y.Sugawara, Y.Yamanishi, T.Oasa and
S.Morita:
“Local Dielectric Breakdown of Thin Silicon Oxide by Dense Contact
Electrification”,
Extended Abstracts of the 1994 International Conference on Solid State Devices
and Materials (SSDM ‘94), Yokohama, 1994, pp.553-555.

12) Y.Fukano, T.Okusako, T.Uchihashi, Y.Sugawara, Y.Yamanishi, T.Oasa
and S.Morita:
“Observation of Positively Charged Trap Site in Silicon Oxide Layer with
an Atomic Force Microscope",
Extended Abstracts of the 1994 International Conference on Solid State Devices
and Materials (SSDM '94), Yokohama, 1994, pp.37-39.

11) Y.Fukano, Y.Uchihashi, T.Okusako, K.Hontani, A.Chayahara,
Y.Sugawara, Y.Yamanishi, T.Oasa and S.Morita;
“Investigation of Trapped Charges in Silicon Oxide Layer with an Atomic Force
Microscope",
Proceedings of Int. Conf. on Advanced Microelectronic Devices and Processing
(AMDP), Sendai, 1994, pp.365-370.

10) Y.Fukano, T.Uchihashi, Y.Sugawara, Y.Yamanishi, T.Oasa and S.Morita;
“Time Evolution of Electrostatic Force Induced by Contact-Electrified Charges
on Thin Silicon Oxide Surface",
Extended Abstracts of the 1993 Int.Conf.on Solid State Devices and Materials
(SSDM '93), Makuhari Messe, Aug.29-Sept.1, 1993, pp.609-611.

9) Y.Sugawara, Y.Fukano, T.Uchihashi, T.Okusako, S.Morita, Y.Yamanishi and
T.Oasa:
“Time-Evolution of Contact-Eelectrified Charges on Silicon Oxide Film
Studied with AFM”,
Proceedings of the Second International Conference on Nanometer Scale
Science and Technology (NANO-II) ,
Moscow, Russia, August 2-6, 1993, pp.747-759.

8) S.Morita, Y.Sugawara and Y.Fukano:
“Scanning Force / Tunneling Microscopy (AFM/STM)",
Abstracts of International Symposium on Intelligent Design and Synthesis of
Electronic Material Systems (IDSEM '92),
Osaka, November 4-6, 1992, Fr-08, pp.147-148.

7) Y.Sugawara, M.Ohta, Y.Kamihara, S.Morita, M.Suzuki and Y.Enomoto:
“Scanning Force Microscopy in the UHV Environment",
Proceedings of the 1st. International Workshop on Microtribology (IWM)
Morioka, October 12-13, 1992, pp.239-245.

6) Y.Sugawara and S.Morita:
“Observation of the Surface by Using AFM/STM”,
Proceedings of the Fourth International Symposium on Advanced Nuclear
Energy Research ?Roles and Direction of Material Science in Nuclear
Technology- (JAERI-M 92-207), Mito, February 5-7, 1992, pp.354-358.

5) Y.Sugawara, Y.Fukano, S.Morita, A.Nakano and T.Ida;
“AFM/STM Investigation of pn Junctions Formed by Ion Implantation",
Extended Abstracts of the 1992 International Conference on Solid State Devices
and Materials, Tsukuba, August 26-28, 1992, PA1-L10, pp.135-136.

4) Y.Fukano, Y.Sugawara, S.Morita, Y.Yamanishi and T.Oasa;
“Nanometer Resolution Measurement of Dielectric Breakdown of Silicon
Dioxide Films with AFM/STM",
Extended Abstracts of the 1992 International Conference on Solid State Devices
and Materials, Tsukuba, August 26-28, 1992, PA1-4, pp.117-119.

3) Y.Sugawara, J.Kushibiki and N.Chubachi;
" Performance of Concave Transducers in Acoustic Microscopy",
Proceedings of 1988 IEEE Ultrasonic Symposium,
Baltimore, 1988, pp.751-756.

2) Y.Sugawara, J.Kushibiki and N.Chubachi;
" Theoretical Analysis on Acoustic Fields Formed by Focusing Devices in
Acoustic Microscopy",
Proceedings of 1986 IEEE Ultrasonic Symposium,
Williamsburg, 1986, pp.783-788.

1) N.Chubachi, J.Kushibiki and Y.Sugawara;
“Off-Centric Concave Transducer for Acoustic Microscopy",
Proceedings of 6th Symposium on Ultrasonic Electronics, Tokyo 1985
[Jpn.J.Appl.Phys., Vol.25, Suppl.25-1 (1986) pp.203-205].