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Papers


2010

145) N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara; "High force sensitivity in Q-controlled phase-modulation atomic force microscopy"
Appl. Phys. Lett., Vol.97, No.1, 011906.

144) Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima and Y. Sugawara; "Multifrequency High-Speed Phase-Modulation Atomic Force Microscopy"
Ultramicroscopy, Vol.110, pp.582.

143) T. Ogawa, S. Kurachi, M. Kageshima, Y. Naitoh, Y. J. Li and Y. Sugawara; "Step Response Measurement of AFM Cantilever for Analysis of Frequency-Resolved Viscoelasticity"
Ultramicroscopy, Vol.110, pp.612.

142) Y. Naitoh, Y. J. Li, H. Nomura, M. Kageshima, and Y. Sugawara; "Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Induced by Noncontact Atomic Force Microscopy at 5K"
Journal of Physical Society of Japan, Vol.79, No.1, pp.013601.

2009

141) Y. Kinoshita, Y. Naitoh, Y. J. Li, M. Kageshima and Y. Sugawara; "Fabrication of Sharp W Coated Tip for Atomic Force Microscopy",
Rev. Sci. Instrum., (submitted).

140) H. Nomura, Y. Kinoshita, Y. Kamimori, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara; "Atomically resolved image of contact potential difference on insulating CaF2/Si(111) surface by using Kelvin probe force microscopy"
Appl. Phys. Lett., (submitted).

139) H. Nomura, Y. Kinoshita, Y. Kamimori, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara; "Identification of CaF1 Interface Layer and CaF2 Layer on CaF2/Si(111) by Using Kelvin Probe Force Microscopy"
Appl. Phys. Lett., (submitted).

138) Y. Naitoh, Y. Kinoshita, Y. J. Li, M. Kageshima, and Y. Sugawara; "The influence of Si Cantilever Tip with/without tungsten coating on NC-AFM Imaging of Ge(001) Surface"
Nanotechnology, Vol. 20, pp.264011.

137) M. Kageshima, T. Chikamoto, T. Ogawa, Y. Hirata, T. Inoue, Y. Naitoh, Y. J. Li, and Y. Sugawara; "Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics"
Review of Scientific Instruments, Vol. 80, pp.023705


2008

136) M. Kinoshita, Y. Naitoh, Y. J. Li, M. Kageshima and Y. Sugawara; "Identification of Subsurface Atom Species Using Noncontact Atomic Force Microscopy"
Jpn. J. Appl. Phys., Vol. 47, No. 10B, 2008, pp.8218-8220.

135) Y. J. Li, N. Kobayashi, H. Nomura, Y. Naitoh, M. Kageshima, and Y. Sugawara; "High-speed Phase-Modulation Atomic Force Microscopy (PM-AFM) in Constant-Amplitude (CA) Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation"
Jpn. J. Appl. Phys. vol. 47 No. 7B (2008) pp.6121-6124.

134) S. Kishimoto, M. Kageshima, Y. Naitoh, Y. J. Li and Y. Sugawara: "Study of oxidized Cu(001) surface using noncontact atomic force microscopy"
Surf. Sci., Vol. 602, 2008, pp.2175-.2182.

133) Y. J. Li, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara; "Phase Modulation Atomic Force Microscopy (PM-AFM) in Constant Excitation Mode Capable of Simultaneous Imaging of Topography and Energy Dissipation"
Appl. Phys. Lett. vol. 92, No. 12 (2008) pp. 121903(1-3).

132) M. Kageshima, Y. Hirata, Y. Nishihara, T. Inoue, S. Kimura, Y. Naitoh and Y. Sugawara; "Viscoelastic analysis of wild-type titin molecule using magnetically modulated off-resonance atomic force microscopy""
AIP Conference Proceedings Vol.982 (2008), pp. 504-507.

131) N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima, and Y. Sugawara; "Theoretical Investigation on Force Sensitivity in Q-controlled Phase Modulation Atomic Force Microscopy in Constant Amplitude Mode"
J. Appl. Phys. vol. 103 (2008) pp. 054305(1-4).


2007

130) Y. Sugawara, N. Kobayashi, M. Kawakami, Y. J. Li, Y. Naitoh and M. Kageshima; "Elimination of Instabilities in Phase Shift Curves in Phase Modulation Atomic Force Microscopy in Constant Amplitude Mode""
Appl. Phys. Lett. vol. 90 (2007) pp. 194104(1-3).

129) Y. Naitoh, K. Momotani, H. Nomura, Y. J. Li, M. Kageshima, and Y. Sugawara; "Force Microscopy Imaging of Rest Atom on Si(111)7~7 Surface under Strong Tip-Surface Interaction"
J. Phys. Soc. Jpn. vol. 76, No. 3 (2007) pp. 033601(1-4).

128) H. Nomura, K. Kawasaki, T. Chikamoto, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara; "Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltageh
Appl. Phys. Lett. vol. 90 (2007) pp. 033118(1-3).


2006

127) M. Kageshima, S. Togo, Y. J. Li, Y. Naitoh and Y. Sugawara; "Wide-band and hysteresis-free regulation of piezoelectric actuator based on induced current for high-speed scanning probe microscopy"
Rev. Sci. Instrum., Vol. 77 (2006) pp. 103701(1-6).

126) N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara; "High-Sensitivity Force Detection by Phase-Modulation Atomic Force Microscopy (PM-AFM)"
Jpn. J. Appl. Phys., Vol. 45, No. 30, (2006) pp.L793-L795.

125) I. Yi, R. Nishi, Y. Sugimoto, M. Abe, Y. Sugawara and S. Morita; "Discrimination of individual atoms on Ge/Si(111)-(7?7) intermixed surface"
Surf. Sci., Vol.600, (2006) pp.2766-2770.

124) Y. J. Li, H. Nomura, N. Ozaki, Y. Naitoh, M. Kageshima, Y. Sugawara, C. Hobbs and L. Kantorovich; "The origin of p(2x1) phase on Si(001) by NC-AFM at 5k"
Phys. Rev. Lett., Vol. 96, (2006), pp.106104(1-4).


2004

123) T. Uda, H. Shigekawa, Y. Sugawara, S. Mizuno, Y. Yamashita, J. Yoshinobu, K. Nakatsuji, H. Kawai and F. Komori; "Ground state of Si(001) surface revisited----Is seeing believing ?",
Progress in Surface Science, Vol. 76, No.6-8, (2004), pp.147-162,.

122) R. Nishi, K. Kitano, I. Yi, Y. Sugawara, S. Morita; "Phase detection method with a positive feedback control using a quartz resonator based atomic force microscope in liquid environment"
Appl. Surf. Sci., Vol.237 (2004), pp.650-652.

121) S.Morita, Y.Sugimoto, N.Oyabu, R.Nishi, O.Custance, Y.Sugawara and M.Abe: "Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope",
J.Electron Microscopy, Vol.53, No.2 (2004) pp.163-168.


2003

120) S. Morita, N. Oyabu, R. Nishi, K. Okamoto, M. Abe, O. Custance, I. Yi, Y. Seino and Y. Sugawara: "Atom Selective Imaging and Mechanical Atom Manipulation based on Noncontact Atomic Force Microscope Method",
e-Journal of Surface Science and Nanotechnology, Vol. 1 (2003) pp.158-170.

119) K.Okamoto, Y.Sugawara and S.Morita: "The Imaging Mechanism of the Atomic-Scale Kelvin Probe Force Microscopy and Its Application to Atomic-Scale Force Mapping",
Jpn. J. Appl. Phys., Vol.42, No.11 (2003) pp.7163-7168.

118) N.Oyabu, O.Custance, I.Yi, Y.Sugawara and S.Morita: "Mechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force Microscopy",
Phys. Rev. Lett., Vol.90, No.17, (2003)176102-1-4.

117) K.Okamoto, K.Yoshimoto, Y.Sugawara, and S.Morita: "KPFM Imaging of Si(111)5γ3x5γ3-Sb Surface for Atom Distinction Using NC-AFM",
Appl. Surf. Sci., Vol.210, No.1-2 (2003) pp.128-133.

116) R.Nishi, S.Araragi, K.Shirai, Y.Sugawara and S.Morita: "Atom Selective Imaging by NC-AFM: Case of Oxygen Adsorbed on a Si(111)7x7 Surface",
Appl. Surf. Sci., Vol.210, No.1-2 (2003) pp.90-92.


2002

115) S.Morita and Y.Sugawara: "Atomically Resolved Imaging of Si(100) 2x1, 2x1:H, 1x1:2H Surfaces with Noncontact Atomic Force Microscopy",
Jpn.J.Appl.Phys., Vol.41, Pat.1, No.7B (2002) pp.4857-4862.

114) S.Araragi, A.Yoshimoto, N.Nakata, Y.Sugawara and S.Morota: "Atomic Resolution Imaging of Si(100)1x1:2H Dihydride Surface with Noncontact Atomic Force Microscopy (NC-AFM)",
Appl.Sur.Sci., Vol.188, No.3-4 (2002) pp.272-278.

113) T.Uozumi, Y.Tomiyoshi, N.Suehira, Y.Sugawara and S.Morita: "Observation of Si(100) Surface with Noncontact Atomic Force Microscope at 5K",
Appl.Sur.Sci., Vol.188, No.3-4 (2002) pp.279-284.

112) Y.Sugawara, Y.Sano, N. Suehira and S.Morita: "Atom Manipulation and Image Artifact on Si(111)7~7 Surface Using a Low Temperature Noncontact Atomic Force Microscope ",
Appl.Sur.Sci., Vol.188, No.3-4 (2002) pp.285-291.

111) K.Okamoto, Y.Sugawara and S.Morita: "The Elimination of the 'Artifact' in the Electrostatic Force Measurement Using a Novel Noncontact Atomic Force Microscope/Electrostatic Force Microscope",
Appl.Sur.Sci., Vol.188, No.3-4 (2002) pp.381-385.

110) S.Morita and Y.Sugawara: "Mapping and Control of Atomic Force on Si(111)γ3xγ3-Ag Surface Using Noncontact Atomic Force Microscope",
Ultramicroscopy, Vol.91, No.1-4 (2002) pp.89-96.


2001

109) S.Morita and Y.Sugawara: "Microscopic Contact Charging and Dissipation",
Thin Solid Film, Vol.393 (2001) pp.310-318.

108) M.Komiyama, T.Uchihashi, Y.Sugawara and S.Morita: "Molecular Orbital Interpretation of Thymine/Graphite nc-AFM Images",
Surface and Interface Analysis, Vol.32, (2001) pp.53-56.

107) N.Suehira, Y.Tomiyoshi, Y.Sugawara and S.Morita: "Low Temperature Noncontact Atomic Force Microscope with Quick Sample and cantilever Exchange Mechanism",
Rev. Sci. Instrum., Vol.72, No.7, (2001) pp.2971-2976.

106) M.Ashino, Y.Sugawara, S.Morita and M.Ishikawa: "Atomic Resolution Noncontact Atomic Force and Scanning Tunneling Microscopy of TiO2(110)-(1x1) and -(1x2): Simultaneous Imaging of Surface Structures and Electronic States",
Phys.Rev.Lett., Vol.86, No.19, (2001) pp.4334-4337.

105) R.Nishi, I.Houda, K.Kitano, Y.Sugawara and S.Morita: "Non-contact Atomic Force Microscope in Air with Quartz Resonator Using FM Detection Method",
Appl. Phys. A, Vol.72 (2001) pp.S93-S95.

104) Y.Sugawara, S.Orisaka, E.Hidaka and S.Morita: "Noncontact AFM Imaging on Si(111) 2~1-Sb Surface with Occupied Lone-Pair Orbitals",
Appl. Phys. A, Vol.72 (2001) pp.S11-S14. (Invited paper)

103) N.Suehira, Y.Sugawara and S.Morita: "Artifact and Fact of Si(111)7x7 Surface Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM)",
Jpn. J. Appl. Phys., Vol.40, No.3B (2001) pp.L292-L294.


2000

102) S.Morita, Y.Sugawara, K.Yokoyama and T.Uchihashi: "Correlation of Frequency Shift Discontinuity to Atomic Position on a Si(111)7x7Surface by Non-Contact Atomic Force Microscopy",
Nanotechnology, Vol.11 (2000) pp.120-123.

101) S.Fujiwaswa, K.Yokoyama, Y.Sugawara and S.Morita: "Load Dependence of Sticking-Domain Distribution in Two-Dimensional Atomic Scale Friction on NaF(100) Surface",
Tribology Lett., Vol.9 (2000) pp.69-72.

100) M.Ashino, T.Uchihashi, K.Yokoyama, Y.Sugawara, S.Morita and M.Ishikawa: "Atom-Resolved Images of Defect-Induced Structure on Non-stoichiometric TiO2 Surface by STM and Noncontact AFM",
Phys.Rev.B, Vol.61, No.20 (2000) pp.13955-13959.

99) T.Uchihashi, N.Choi, M.Tanigawa, M.Ashino, Y.Sugawara, H.Nishijima, S.Akita,Y.Nakayama, H.Tokumoto, K.Yokoyama,S.Morita andM.Ishikawa: "Carbon-Nanotube Tip for the Highly-Reproducible Imaging of DNA Helical Turns by Noncontact AFM",
Jpn.J.Appl.Phys., Vol.39, No.8B (2000) pp.L887-L889.

98) M.Ashino, T.Uchihashi, K.Yokoyama, Y.Sugawara, S.Morita and M.Ishikawa: "Structures of an Oxygen-Deficient TiO2(110) Studied by Noncontact Atomic Force Microscopy",
Jpn.J.Appl.Phys., Vol.39, No.6B (2000) pp.3765-3768.

97) N.Suehira, K.Sugiyama, S.Watanabe, T.Fujii, Y.Sugawara and S.Morita: "Development of Low-Temperature Ultrahigh-Vacuum Noncontact Atomic Force Microscopy with PZT-lever and Scanning Tunneling Microscope",
Appl.Sur.Sci. ,Vol.157, No.4 (2000) pp.343-348.

96) R.Nishi, I.Houda, T.Aramata, Y.Sugawara and S.Morita: "Phase change Detection of Attractive Force Gradient by Using a Quartz Resonator in Noncontact Atomic Force Microscopy",
Appl.Sur.Sci., Vol.157, No.4 (2000) pp. 332-336.

95) T.Uchihashi, M.Ashino, T. Ishida, Y.Sugawara, M.Komiyama, W.Mizutani, Y.Yokoyama, S.Morita, H.Tokumoto and M.Ishikawa: "High Resolution Imaging of Organic Monolayers Using Noncontact AFM",
Appl.Sur.Sci., Vol.157, No.4 (2000) pp.244-250.

94) Y.Sugawara, S.Orisaka and S.Morita: "Noncontact AFM Imaging on Al-adsorbed Si(111) Surface with an Empty Orbital",
Appl.Sur.Sci., Vol.157, No.4 (2000) pp.239-243.

93) M.Ashino, T.Uchihashi, K.Yokoyama, Y.Sugawara, S.Morita, and M.Ishikawa: "Atomic-Scale Structures on a Non-Stoichiometric TiO2(110) Surface Studied by Noncontact AFM",
Appl.Sur.Sci., Vol.157, No.4 (2000) pp.212-217.

92) T.Uchihashi, M.Tanigawa, M.Ashino, Y.Sugawara, K.Yokoyama, S.Morita and M.Ishikawa: "Identification of B-form DNA in an Ultrahigh Vacuum by Noncontact-mode Atomic Force Microscopy",
Langmuir, Vol.16, No.3 (2000) pp.1349-1353.

91) S.Morita, M.Abe, K.Yokoyama and Y.Sugawara; "Defects and their Charge Imaging on Semiconductor Surfaces by Noncontact Atomic Force Microscopy and Spectroscopy",
J.Cryst.Growth, Vol.210 (2000) pp.408-415.

90) K.Yokoyama, T.Ochi, A.Yoshimoto, Y.Sugawara, S.Morita: "Atomic Resolution Imaging on Si(100)2x1 and Si(100)2x1-H Surfaces Using a Noncontact Atomic Force Microscope",
Jpn.J.Appl.Phys., Vol.39, No.2A (2000) pp.L113-L115.

89) K.Yokoyama, T.Ochi, T.Uchihashi, M.Ashino, Y.Sugawara, N.Suehira and S.Morita: "Optical Beam Deflection Noncontact Atomic Force Microscope Optimized with Three-Dimensional Beam Adjustment Mechanism",
Rev.Sci.Instru., Vol.71, No.1 (2000) pp.128-132.


1999

88) K.Yokoyama, T.Ochi, Y.Sugawara and S.Morita: "Atomically Resolved Ag Imaging on Si(111)γ3‚˜γ3-Ag Surface with Noncontact Atomic Force Microscope",
Phys.Rev.Lett., Vol.83, No.24 (1999) pp.5023-5026.

87) S.Morita, Y.Sugawara, S.Orisaka and T.Uchihashi: "Missing Ag Atom on Si(111)γ3‚˜γ3-Ag Surface Observed by Noncontact Atomic Force Microscope",
Jpn.J.Appl.Phys., Vol.38, No.11B (1999) pp.L1342-L1344.

86) T.Uchihashi, Y.Sugawara, K.Yokoyama, S.Morita and T.Okada: "Self-Assembled Monolayer of Adenine Base on Graphite Studied by Noncontact Atomic Force Microscopy",
Phys.Rev.B, Vol.60, No.11 (1999) pp.8309-8313.

85) Y.Sugawara, T.Minobe, S.Orisaka, T.Uchihashi, T.Tsukamoto and S.Morita: "Non-contact AFM Images Measured on Si(111)γ3‚˜γ3-Ag and Ag(111) Surfaces",
Surface and Interface Analysis, Vol.27, No.5-6 (1999) pp.456-461.

84) S.Morita and Y.Sugawara; "Guidelines for the Achievement of True Atomic Resolution with Noncontact Atomic Force Microscopy",
Appl.Sur.Sci., Vol.140, No.3-4 (1999) pp.406-410.

83) M.Abe, Y.Sugawara, K.Sawada, Y.Andoh and S.Morita: "Near-field Optical Imaging Using Force Detection with New Tip-Electrode Geometry",
Appl.Sur.Sci., Vol.140, No.3-4 (1999) pp.383-387.

82) Y.Sugawara, T.Uchihashi, M.Abe and S.Morita: "True Atomic Resolution Imaging of Surface Structure and Surface Charge on the GaAs(110)",
Appl.Sur.Sci., Vol.140, No.3-4 (1999) pp.371-375.

81) T.Uchihashi, Y.Sugawara, T.Tsukamoto, T.Minobe, S.Orisaka T.Okada and S.Morita: "Imaging of Chemical Reactivity and Buckled Dimers on Si(100) 2~1 Reconstructed Surface with Noncontact AFM ",
Appl.Sur.Sci., Vol.140, No.3-4 (1999) pp.304-308.

80) T.Minobe, T.Uchihashi, T.Tsukamoto, S.Orisaka, Y.Sugawara and S.Morita: "Distance Dependence of Noncontact AFM Image Contrast on Si(111)γ3‚˜γ3-Ag Structure",
Appl.Sur.Sci., Vol.140, No.3-4 (1999) pp.298-303.

79) S.Orisaka, T.Minobe, Y.Sugawara and S.Morita: "The Atomic Resolution Imaging of Metallic Ag(111) Surface by Noncontact Atomic Force Microscope",
Appl.Sur.Sci., Vol.140, No.3-4 (1999) pp. 243-246.


1998

78) M.Abe, Y.Sugawara, Y.Hara, K.Sawada and S.Morita: "Optical Near-Field Imaging Using the Kelvin Probe Technique",
Jpn.J.Appl.Phys., Vol.37, No.9A/B (1998) pp.L1074-L1077.

77) S.Fujisawa, K.Yokoyama, Y.Sugawara and S.Morita: "Analysis of experimental load dependence of two-dimensional atomic-scale friction",
Phys.Rev. B, Vol.58, No.8 (1998) pp.4909-4916.

76) N.Sasaki, M.Tsukada, S.Fujisawa, Y.Sugawara and S.Morita: "Theoretical analysis of atomic-scale friction in frictional-force microscopy",
Tribology Lett., Vol.4 (1998) pp.125-128.

75) R.Nishi, Y.Nakao, T.Ohta, Y.Sugawara, S.Morita and T.Okada: "New computed tomography algorithm of electrostatic force microscopy based on the singular value decomposition combined with the discrete Fourier transform",
Jpn.J.Appl.Phys., Vol.37, No.4A (1998) pp.L417-L419.

74) H.Ueyama, Y.Sugawara and S.Morita: "Stable operation mode for dynamic noncontact atomic force microscopy",
Appl.Phys. A, Vol.66 (1998) pp.S295-S297.

73) N.Sasaki, M.Tsukada, S.Fujisawa, Y.Sugawara, S.Morita and K.Kobayashi: "Load dependence of the frictional-force microscopy image pattern of the graphite surface",
Phys.Rev. B, Vol. 57, No. 7 (1998) pp.3785-3786.

72) M.Abe, Y.Sugawara, Y.Hara, K.Sawada and S.Morita: "Force Imaging of Optical Near-Field Using Noncontact Mode Atomic Force Microscopy",
Jpn.J.Appl.Phys., Vol. 37, No.2A (1998) pp.L167-L169.


1997

71) R.Nishi, T.Ohta, Y.Sugawara, S.Morita and T.Okada: "Simulated Computed Tomography for Reconstruction of Vacancies from Atomic Force Microscope Image",
Jpn.J.Appl.Phys., Vol. 36, No.10B (1997) pp.L1410-L1412.

70) T.Uchihashi, Y.Sugawara, T.Tsukamoto, M.Ohta and S.Morita: "Role of a covalent bonding interaction in noncontact-mode atomic-force microscopy on Si(111)7~7 surface",
Phys.Rev. B, Vol.56, No.16 (1997) pp.9834-9840.

69) J.Ohgami, Y.Sugawara, S.Morita and T.Ozaki: "Growth of Two-Dimensional Nucleus on a Cleaved (010) Surface of (NH2CH2COOH)3₯H2SO4",
J.Phys.Soc.Jpn., Vol.66, No.9 (1997) pp.2747-2750.

68) N.Sasaki, M.Tsukada, S.Fujisawa, Y.Sugawara, S.Morita and K.Kobayashi: "Analysis of frictional-force image patterns of a graphite surface"
J.Vac.Sci.Technol.B, Vol.15, No.4 (1997) pp.1479-1482.

67) M.Abe, T.Uchihashi, M.Ohta, M.Ohta, H.Ueyama, Y.Sugawara and S.Morita: "Detection mechanism of optical evanescent field using a noncontact mode Atomic force microscope with a frequency modulation detection method"
J.Vac.Sci.Technol.B, Vol.15, No.4 (1997) pp.1512-1515.

66) T.Uchihashi, M.Ohta, Y.Sugawara, Y.Yanase, T.Shigematsu, M.Suzuki and S.Morita: "Development of ultrahigh vacuum atomic force microscopy with frequency modulation detection and its application to electrostatic force measurement"
J.Vac.Sci.Technol.B, Vol.15, No.4 (1997) pp.1543-1546.

65) T.Uchihashi, A.Nakano, T.Ida, Y.Ando, R.Kaneko Y.Sugawara and S.Morita; "Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air",
Jpn.J.Appl.Phys., Vol.36, Part I, No.6A (1997) pp.3755-3758.

64) M.Abe, T.Uchihashi, M.Ohta, H.Ueyama, Y.Sugawara and S.Morita: "Measurement of the Evanescent Field Using Noncontact Mode Atomic Force Microscope",
Opt. Rev., Vol.4, No.1B (1997) pp.232-235.

63) Y.Sugawara, H.Ueyama, T.Uchihashi, M.Ohta, S.Morita, M.Suzuki and S.Mishima: "True atomic resolution imaging with noncontact atomic force microscopy",
Appl.Sur.Sci., Vol.113/114 (1997) pp.364-370 (Invited Paper).


1996

62) S.Morita, T.Uchihashi, T.Okusako, Y.Yamanishi and T.Oasa and Y.Sugawara; "Stability of Densely Contact-Electrified Charges on Thin Silicon Oxide in Air ",
Jpn.J.Appl.Phys., Vol.35, Part 1, No.11 (1996) pp.5811-5814.

61) T.Ohta, Y.Sugawara and S.Morita: "Feasibility Study on a Novel Type of Computerized Tomography Based on Scanning Probe Microscope ",
Jpn.J.Appl.Phys., Vol.35, Part 2, No.9B (1996) pp.L1222-L1224.

60) S.Morita, S.Fujisawa, E.Kishi, M.Ohta, H.Ueyama and Y.Sugawara: "Contact and noncontact mode imaging by atomic force microscopy",
Thin Solid Film, Vol.273 (1996) pp.138-142.

59) J.Ohgami, Y.Sugawara, S.Morita, E.Nakamura and T.Ozaki: "Time Evolution of Surface Topography around a Domain Wall in Ferroelectric (NH2CH2COOH)3₯H2SO4",
Jpn.J.Appl.Phys., Vol.35, Part 1, No.9B (1996) pp.5174-5177.

58) Y.Sugawara, T.Tsuyuguchi, T.Uchihashi, T.Okusako, Y.Fukano, Y.Yamanishi, T.Oasa and S.Morita,; "Density saturation of densely contact-electrified negative charges on a thin silicon oxide sample due to the Coulomb repulsive force",
Philos. Mag. A, Vol.74, No.5 (1996) pp.1339-1346.

57) S.Fujisawa, Y.Sugawara and S.Morita: "Load dependence of the periodicity in friction force images on the NaF(100) surface",
Philos. Mag. A, Vol.74, No.5 (1996) pp.1329-1337.

56) J.Ohgami, Y.Sugawara, S.Morita, E.Nakamura and T.Ozaki: "Determination of Sign of Surface Charges of Ferroelectric TGS Using Electrostatic Force Microscope Combined with the Voltage Modulation Technique",
Jpn.J.Appl.Phys., Vol.35, Part 1, No.5A (1996) pp.2734-2739.

55) S.Fujisawa, Y.Sugawara and S.Morita: "Localized Fluctuation of a Two-Dimensional Atomic-Scale Friction",
Jpn.J.Appl.Phys., Vol.35, Part 1, No.11 (1996) pp.5909-5913.

54) Y.Fukano, Y.Sugawara, T.Uchihashi, T.Okusako, S.Morita, Y.Yamanishi and T.Oasa; "Phase Transition of Contact-Electrified Negative Charges on a Thin Silicon Oxide in Air",
Jpn.J.Appl.Phys., Vol.35, Part 1, No.4A (1996) pp.2394-2401.

53) Y.Sugawara, M.Ohta, H.Ueyama, S.Morita, F.Osaka, S.Ohkouchi, M.Suzuki and S.Mishima: "Atomic resolution Imaging of InP(110) surface observed with ultrahigh vacuum atomic force microscope in noncontact mode",
J.Vac.Sci.Technol.B, Vol.14, No.2 (1996) pp.953-956.

52) T.Uchihashi, T.Okusako, Y.Sugawara, Y.Yamanishi, T.Oasa and S.Morita; "Correlation between contact-electrified charge groups on a thin silicon oxide",
J.Vac.Sci.Technol.B, Vol.14, No.2 (1996) pp.1055-1059.

51) T.Uchihashi, T.Okusako, Y.Sugawara, Y.Yamanishi, T.Oasa and S.Morita; "Proximity effects of negative charge groups contact-electrified on thin silicon oxide in air",
J.Appl.Phys., Vol.79, No.8 (1996) pp.4174-4177.

50) S.Morita, S.Fujisawa and Y.Sugawara: "Spatially quantized friction with a lattice periodicity",
Surface Science Reports, Vol.23, No.1 (1996) pp.1-42.


1995

49) M.Ohta, H.Ueyama, Y.Sugawara and S.Morita: "Contrast of Atomic-Resolution Images from a Noncontact Ultrahigh-Vacuum Atomic Force Microscope",
Jpn.J.Appl.Phys., Vol.34, Part 2, No.12B (1995) pp.L1692-L1694.

48) Y.Sugawara, M.Ohta, H.Ueyama and S.Morita: "Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy",
Science, Vol.270 (1995) pp.1646-1648.

47) H.Ueyama, M.Ohta, Y.Sugawara and S.Morita: "Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope",
Jpn.J.Appl.Phys., Vol.34, Part 2, No.8B (1995) pp.L1086-L1088.

46) S.Fujisawa, E.Kishi, Y.Sugawara and S.Morita: "Two-dimensional quantized friction observed with two-dimensional frictional force microscope",
Tribology Lett., Vol.1 (1995) pp.121-127.

45) S.Fujisawa, E.Kishi, Y.Sugawara and S.Morita: "Load dependence of two-dimensionally atomic-scale friction",
Phys.Rev.B, Vol.52, No.7 (1995) pp.5302-5305.

44) S.Fujisawa, E.Kishi, Y.Sugawara and S.Morita: "Two-dimensionally discrete friction on NaF(100) surface with the lattice periodicity",
Nanotechnology, Vol.5 (1995) pp.8-11.

43) M.Ohta, Y.Sugawara, F.Osaka, S.Ohkouchi, M.Suzuki, S.Mishima, T.Okada and S.Morita: "Atomically Resolved Image of Cleaved Surface of Compound Semiconductors Observed with an Ultrahigh Vacuum Atomic Force Microscope",
J.Vac.Sci.Technol.B, Vol.13, No.3 (1995) pp.1265-1267.

42) S.Fujisawa, E.Kishi, Y.Sugawara and S.Morita: "Atomic-scale friction observed with two-dimensional frictional force microscope",
Phys.Rev.B, Vol.51, No.12 (1995) pp.7849-7857.

41) Y.Sugawara, M.Ohta, H.Ueyama and S.Morita: "Atomic-Resolution Image of ZnSSe(110) Surface with an Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)",
Jpn.J.Appl.Phys., Vol.34, No.4A (1995) pp.L462-464.

40) S.Fujisawa, E.Kishi, Y.Sugawara and S.Morita: "Lateral force curve for atomic force/lateral force microscope calibration",
Appl.Phys.Lett., Vol.66, No.4 (1995) pp.526-528.


1994

39) Y.Fukano, T.Uchihashi, T.Okusako, A.Chayahara, Y.Sugawara, Y.Yamanishi, T.Oasa and S.Morita; "Parameter Dependence of Stable State of Densely Contact-Electrified Electrons on Thin Silicon Oxide",
Jpn.J.Appl.Phys., Vol.33, Part.1, No.12A (1994) pp.6739-6745.

38) T.Uchihashi, Y.Fukano, Y.Sugawara, S.Morita, A.Nakano, T.Ida and T.Okada; "Potentiometry Combined with Atomic Force Microscope",
Jpn.J.Appl.Phys., Vol.33, Part.2, No.11A (1994) pp.L1562-L1564.

37) T.Uchihashi, T.Okusako, T.Tsuyuguchi, Y.Sugawara, M.Igarashi, R.Kaneko and S.Morita: "Charge Storage on Thin SrTiO3 Film by Contact Electrification",
Jpn.J.Appl.Phys., Vol.33, Part.1, No.9B (1994) pp.5573-5576.

36) M.Ohta, Y.Sugawara, S.Morita, H.Nagaoka, S.Mishima and T.Okada; "Ultrahigh vacuum atomic force microscope with sample cleaving mechanism",
J.Vac.Sci.Technol.B, Vol.12, No.3 (1994) pp.1705-1707.

35) S.Fujisawa, Y.Sugawara, S.Morita, S.Ito, S.Mishima and T.Okada; "Study on the stick-slip phenomenon on a cleaved surface of the Muscovite mica using an atomic force /lateral force microscope",
J.Vac.Sci.Technol.B, Vol.12, No.3 (1994) pp.1635-1637.

34) Y.Sugawara, Y.Fukano, T.Uchihashi, S.Morita, Y.Yamanishi, T.Oasa and T.Okada; "Atomic force microscopy studies of contact-electrified charges on silicon oxide film",
J.Vac.Sci.Technol.B, Vol.12, No.3 (1994) pp.1627-1630.

33) T.Uchihashi, T.Okusako, Y.Sugawara, Y.Yamanashi, T.Oasa and S,Morita; "Heat Treatment and Steaming Effects of Silicon Oxide upon Electron Dissipation on Silicon Oxide Surface",
Jpn.J.Appl.Phys., Vol.33, No.8A (1994) pp.L1128-L1130.

32) T.Okusako, T.Uchihashi, A.Nakano, T.Ida, Y.Sugawara, and S.Morita; "Dissipation of Contact Electrified Electrons on Dielectric Thin Films with Silicon Substrate",
Jpn.J.Appl.Phys. Vol.33, No.7A (1994) pp.L959-L961.

31) T.Tsuyuguchi, T.Uchihashi, T.Okusako, Y.Sugawara, S.Morita, Y.Yamanishi and T.Oasa; "Contact Electrification on Thin Silicon Oxide in a Vacuum",
Jpn.J.Appl.Phys., Vol.33, No.7B (1994) pp.L1046-L1048.

30) Y.Fukano, T.Uchihashi, T.Okusako, A.Chayahara, Y.Sugawara, Y.Yamanishi, T.Oasa and S.Morita; "Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope",
Jpn.J.Appl.Phys., Vol.33, Part 1, No.1B (1994) pp.379-382.

29) Y.Fukano, K.Hontani, Y.Uchihashi, T.Okusako, A.Chayahara, Y.Sugawara, Y.Yamanishi, T.Oasa and S.Morita; "Time Dependent Dielectric Breakdown of Thin Silicon Oxide Using Dense Contact Electrification",
Jpn.J.Appl.Phys. Vol.33, Part.1, No.6B (1994) pp.3756-3760.

28) S.Fujisawa, E.Kish, Y.Sugawara and S.Morita; "Fluctuation in Two-Dimensional Stick-Slip Phenomenon Observed with Two-Dimensional Frictional Force Microscope",
Jpn.J.Appl.Phys. Vol.33, Part.1, No.6B (1994) pp.3752-3755.

27) Y.Sugawara, M.Ohta, K.Hontani, S.Morita, F.Osaka, S.Ohkouchi, M.Suzuki, H.Nagaoka, S.Mishima and T.Okada; "Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope",
Jpn.J.Appl.Phys., Vol.33, Part.1, No.6B (1994) pp.3739-3742.

26) T.Uchihashi, T.Okusako, J.Yamada, Y.Fukano, Y.Sugawara, M.Igarashi, R.Kaneko and S.Morita; "Contact Electrification on Thin SrTiO3 Film by Atomic Force Microscope",
Jpn.J.Appl.Phys., Vol.33, No.3A (1994) pp.L374-L376.

25) S.Morita, Y.Fukano, T.Uchihashi, Y.Sugawara, Y.Yamanishi and T.Oasa; "Dissipation of contact-electrified charge on thin Si-oxide studied by atomic force microscope",
Applied Surface Science, Vol.75 (1994) pp.151-156.

24) S.Fujisawa, M.Ohta, T.Konishi, Y.Sugawara and S.Morita; "Difference between the forces measured by an optical lever deflection and by an optical interferometer in atomic force microscope",
Rev. of Scientific Instruments, Vol.65, No.3, March (1994) pp.644-647.

23) Y.Sugawara, S.Morita, Y.Fukano, T.Uchihashi, T.Okusako, A.Chayahara, Y.Yamanishi and T.Oasa; "Spatial distribution of densely contact-electrified charges on a thin silicon oxide",
Jpn.J.Appl.Phys., Vol.33, No.1A (1994) pp.L74-L77.

22) Y.Sugawara, S.Morita, Y.Fukano, T.Uchihashi, T.Okusako, A.Chayahara, Y.Yamanishi and T.Oasa; "Spatial distribution and its phase transition of densely contact-electrified electrons on a thin silicon oxide",
Jpn.J.Appl.Phys., Vol.33, No.1A (1994) pp.L70-L73.

21) M.Ohta, Y.Sugawara, K.Hontani, S.Morita, F.Osaka, M.Suzuki, H.Nagaoka, S.Mishima and T.Okada; "Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force Microscope",
Jpn.J.Appl.Phys., Vol.33, No.1A (1994) pp.L52-L54.


1993

20) S.Fujisawa, Y.Sugawara and S.Morita: "Origin of the Force Measured by an Atomic Force/Lateral Force Microscope (AFM/LFM)",
Microbeam Analysis, Vol.2 (1993) pp.311-316.

19) S.Fujisawa, Y.Sugawara, S.Itoh, S.Mishima, T.Okada and S.Morita: "Two-dimensional stick-slip phenomenon with atomic resolution",
Nanotechnology, Vol.4, No.3 (1993) pp.138-142.

18) S.Morita, Y.Sugawara, Y.Fukano, T.Uchihashi, T.Okusako, A.Chayahara, Y.Yamanishi and T.Oasa: "Stable-unstable phase transition of densely contact-electrified electrons on a thin silicon oxide",
Jpn.J.Appl.Phys., Vol.32, No.12B (1993) pp.L1852-L1854.

17) S.Morita, Y.Fukano, T.Uchihashi, T.Okusako, Y.Sugawara, Y.Yamanishi and T.Oasa: "Reproducible and Controllable Contact Electrification on a Thin Insulator",
Jpn.J.Appl.Phys., Vol.32, No.11B (1993) pp.L1701-L1703.

16) Y.Sugawara, M.Ohta, T.Konishi, S.Morita, M.Suzuki and Y.Enomoto: "Effects of humidity and tip radius on the adhesive force measured with atomic force microscopy",
Wear, Vol.168 (1993) pp.13~16.

15) S.Morita, Y.Sugawara and Y.Fukano: "Atomic Force Microscope Combined with Scanning Tunneling Microscope [AFM/STM]",
Jpn.J.Appl.Phys., Vol.32, Part 1, No.6B (1993) pp.2983-2988.

14) M.Ohta, T.Konishi, Y.Sugawara, S.Morita, M.Suzuki and Y.Enomoto: "Observation of atomic defect on LiF(100) surface with UHV AFM",
Jpn.J.Appl.Phys., Vol.32, Part 1, No.6B (1993) pp.2980-2982.

13) Y.Fukano, Y.Sugawara, Y.Yamanishi, T.Oasa and S.Morita; "Scanning Force / Tunneling Microscopy as a Novel Technique for the Study of Nanometer-Scale Dielectric Breakdown of Silicon Oxide Layer",
Jpn.J.Appl.Phys., Vol.32, Part 1, No.1B (1993) pp.290-293.


1992

12) Y.Sugawara, Y.Fukano, Y.Kamihara, S.Morita, A.Nakano, T.Ida and R.Kaneko; "AFM/STM investigation of polycrystalline Si surface",
Ultramicroscopy, Vol.42-44 (1992) pp.1372-1375.

11) Y.Sugawara, Y.Fukano, A.Nakano, T.Ida and S.Morita; "Oxidation Site of Polycrystalline Silicon Surface Studied Using Scanning Force/Tunneling Microscope (AFM/STM) in Air",
Jpn.J.Appl.Phys.,Vol.31, Part2, No.6A (1992) pp.L725-L727.


1991

10) K.Endo, Y.Sugawara, S.Mishima, T.Okada and S.Morita; "In Situ Imaging of Electrochemical Deposition of Ag on Au(111)",
Jpn.J.Appl.Phys., Vol.30, No.10 (1991) pp.2592-2593.

9) Y.Sugawara, T.Ishizaka and S.Morita; "Scanning force/tunneling microscopy of a graphite surface in air",
J.Vac.Sci.Technol.B, Vol.9, No.2 (1991) pp.1092-1095.


1990

8) Y.Sugawara, T.Ishizaka and S.Morita; "Origin of Anomalous Corrugation Height of STM Images of Graphite",
Jpn.J.Appl.Phys., Vol.29, No.8 (1990) pp.1533-1538.

7) Y.Sugawara, T.Ishizaka and S.Morita; "Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM)",
Jpn.J.Appl.Phys., Vol.29, No.8 (1990) pp.1539-1543.

6) T.Ishizaka, Y.Sugawara, K.Kumagai and S.Morita; "Anomalous Force Dependence of AFM Corrugation Height of a Graphite Surface in Air",
Jpn.J.Appl.Phys. Vol.29, No.7 (1990) pp.L1196-L1198.

5) Y.Sugawara, T.Ishizaka, S.Morita, S.Imai and N.Mikoshiba; "Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface",
Jpn.J.Appl.Phys., Vol.29, No.3 (1990) pp.L502-L504.

4) Y.Sugawara, T.Ishizaka, S.Morita, S.Imai and N.Mikoshiba; "Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface",
Jpn.J.Appl.Phys., Vol.29, No.1 (1990) pp.L157-L159.

3) T.Ishizaka, S.Morita, Y.Sugawara, T.Okada, S.Mishima, S.Imai and N.Mikoshiba; "Surface Imaging in Air with a Force Microscope",
J.Vac.Sci.Technol.A, Vol.8, No.1 (1990) pp.391-393.

2) A.Yagi, S.Tsukada, Y.Takahashi, Y.Sugawara, S.Morita, T.Okada, S.Imai and N.Mikoshiba; "Differential Conductance Imaging under AC Tunneling Bias",
J.Vac.Sci.Technol.A, Vol.8, No.1 (1990) pp.336-338.


1989

1) S.Morita, T.Ishizaka, Y.Sugawara, T.Okada, S.Mishima, S.Imai and N.Mikoshiba;"Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope",
Jpn.J.Appl.Phys., Vol.28, No.9 (1989) pp.L1634-L1636.