Papers
2010
145) N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara;
"High force sensitivity in Q-controlled phase-modulation atomic force microscopy"
Appl. Phys. Lett., Vol.97, No.1, 011906.
144) Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima and Y. Sugawara;
"Multifrequency High-Speed Phase-Modulation Atomic Force Microscopy"
Ultramicroscopy, Vol.110, pp.582.
143) T. Ogawa, S. Kurachi, M. Kageshima, Y. Naitoh, Y. J. Li and Y. Sugawara;
"Step Response Measurement of AFM Cantilever for Analysis of Frequency-Resolved Viscoelasticity"
Ultramicroscopy, Vol.110, pp.612.
142) Y. Naitoh, Y. J. Li, H. Nomura, M. Kageshima, and Y. Sugawara;
"Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Induced by Noncontact Atomic Force Microscopy at 5K"
Journal of Physical Society of Japan, Vol.79, No.1, pp.013601.
2009
141) Y. Kinoshita, Y. Naitoh, Y. J. Li, M. Kageshima and Y. Sugawara;
"Fabrication of Sharp W Coated Tip for Atomic Force Microscopy",
Rev. Sci. Instrum., (submitted).
140) H. Nomura, Y. Kinoshita, Y. Kamimori, Y. J. Li, Y. Naitoh, M. Kageshima, and
Y. Sugawara;
"Atomically resolved image of contact potential difference on insulating CaF2/Si(111) surface by using Kelvin probe force microscopy"
Appl. Phys. Lett., (submitted).
139) H. Nomura, Y. Kinoshita, Y. Kamimori, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara;
"Identification of CaF1 Interface Layer and CaF2 Layer on CaF2/Si(111) by Using Kelvin Probe Force Microscopy"
Appl. Phys. Lett., (submitted).
138) Y. Naitoh, Y. Kinoshita, Y. J. Li, M. Kageshima, and Y. Sugawara;
"The influence of Si Cantilever Tip with/without tungsten coating on NC-AFM Imaging of Ge(001) Surface"
Nanotechnology, Vol. 20, pp.264011.
137) M. Kageshima, T. Chikamoto, T. Ogawa, Y. Hirata, T. Inoue, Y. Naitoh, Y. J. Li, and Y. Sugawara;
"Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics"
Review of Scientific Instruments, Vol. 80, pp.023705
2008
136) M. Kinoshita, Y. Naitoh, Y. J. Li, M.
Kageshima and Y. Sugawara; "Identification of
Subsurface Atom Species Using Noncontact Atomic
Force Microscopy"
Jpn. J. Appl. Phys., Vol. 47,
No. 10B, 2008, pp.8218-8220.
135) Y. J. Li, N. Kobayashi, H. Nomura, Y.
Naitoh, M. Kageshima, and Y. Sugawara; "High-speed
Phase-Modulation Atomic Force Microscopy (PM-AFM)
in Constant-Amplitude (CA) Mode Capable of
Simultaneous Measurement of Topography and Energy
Dissipation"
Jpn. J. Appl. Phys. vol. 47 No. 7B
(2008) pp.6121-6124.
134) S. Kishimoto, M. Kageshima, Y. Naitoh, Y.
J. Li and Y. Sugawara: "Study of oxidized Cu(001)
surface using noncontact atomic force
microscopy"
Surf. Sci., Vol. 602, 2008,
pp.2175-.2182.
133) Y. J. Li, N. Kobayashi, Y. Naitoh, M.
Kageshima, and Y. Sugawara; "Phase Modulation
Atomic Force Microscopy (PM-AFM) in Constant
Excitation Mode Capable of Simultaneous Imaging of
Topography and Energy Dissipation"
Appl. Phys.
Lett. vol. 92, No. 12 (2008) pp. 121903(1-3).
132) M. Kageshima, Y. Hirata, Y. Nishihara, T.
Inoue, S. Kimura, Y. Naitoh and Y. Sugawara;
"Viscoelastic analysis of wild-type titin molecule
using magnetically modulated off-resonance atomic
force microscopy""
AIP Conference Proceedings
Vol.982 (2008), pp. 504-507.
131) N. Kobayashi, Y. J. Li, Y. Naitoh, M.
Kageshima, and Y. Sugawara; "Theoretical
Investigation on Force Sensitivity in Q-controlled
Phase Modulation Atomic Force Microscopy in
Constant Amplitude Mode"
J. Appl. Phys. vol.
103 (2008) pp. 054305(1-4).
2007
130) Y. Sugawara, N. Kobayashi, M. Kawakami, Y.
J. Li, Y. Naitoh and M. Kageshima; "Elimination of
Instabilities in Phase Shift Curves in Phase
Modulation Atomic Force Microscopy in Constant
Amplitude Mode""
Appl. Phys. Lett. vol. 90
(2007) pp. 194104(1-3).
129) Y. Naitoh, K. Momotani, H. Nomura, Y. J.
Li, M. Kageshima, and Y. Sugawara; "Force
Microscopy Imaging of Rest Atom on Si(111)7~7
Surface under Strong Tip-Surface
Interaction"
J. Phys. Soc. Jpn. vol. 76, No. 3
(2007) pp. 033601(1-4).
128) H. Nomura, K. Kawasaki, T. Chikamoto, Y.
J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara;
"Dissipative force modulation Kelvin probe force
microscopy applying doubled frequency ac bias
voltageh
Appl. Phys. Lett. vol. 90 (2007) pp.
033118(1-3).
2006
127) M. Kageshima, S. Togo, Y. J. Li, Y. Naitoh
and Y. Sugawara; "Wide-band and hysteresis-free
regulation of piezoelectric actuator based on
induced current for high-speed scanning probe
microscopy"
Rev. Sci. Instrum., Vol. 77 (2006)
pp. 103701(1-6).
126) N. Kobayashi, Y. J. Li, Y. Naitoh, M.
Kageshima and Y. Sugawara; "High-Sensitivity Force
Detection by Phase-Modulation Atomic Force
Microscopy (PM-AFM)"
Jpn. J. Appl. Phys., Vol.
45, No. 30, (2006) pp.L793-L795.
125) I. Yi, R. Nishi, Y. Sugimoto, M. Abe, Y.
Sugawara and S. Morita; "Discrimination of
individual atoms on Ge/Si(111)-(7?7) intermixed
surface"
Surf. Sci., Vol.600, (2006)
pp.2766-2770.
124) Y. J. Li, H. Nomura, N. Ozaki, Y. Naitoh,
M. Kageshima, Y. Sugawara, C. Hobbs and L.
Kantorovich; "The origin of p(2x1) phase on
Si(001) by NC-AFM at 5k"
Phys. Rev. Lett., Vol.
96, (2006), pp.106104(1-4).
2004
123) T. Uda, H. Shigekawa, Y. Sugawara, S.
Mizuno, Y. Yamashita, J. Yoshinobu, K. Nakatsuji,
H. Kawai and F. Komori; "Ground state of Si(001)
surface revisited----Is seeing believing
?",
Progress in Surface Science, Vol. 76,
No.6-8, (2004), pp.147-162,.
122) R. Nishi, K. Kitano, I. Yi, Y. Sugawara,
S. Morita; "Phase detection method with a positive
feedback control using a quartz resonator based
atomic force microscope in liquid
environment"
Appl. Surf. Sci., Vol.237 (2004),
pp.650-652.
121) S.Morita, Y.Sugimoto, N.Oyabu, R.Nishi,
O.Custance, Y.Sugawara and M.Abe: "Atom-selective
imaging and mechanical atom manipulation using the
non-contact atomic force
microscope",
J.Electron Microscopy, Vol.53,
No.2 (2004) pp.163-168.
2003
120) S. Morita, N. Oyabu, R. Nishi, K. Okamoto,
M. Abe, O. Custance, I. Yi, Y. Seino and Y.
Sugawara: "Atom Selective Imaging and Mechanical
Atom Manipulation based on Noncontact Atomic Force
Microscope Method",
e-Journal
of Surface Science and Nanotechnology, Vol. 1
(2003) pp.158-170.
119) K.Okamoto, Y.Sugawara and S.Morita: "The
Imaging Mechanism of the Atomic-Scale Kelvin Probe
Force Microscopy and Its Application to
Atomic-Scale Force Mapping",
Jpn. J. Appl.
Phys., Vol.42, No.11 (2003) pp.7163-7168.
118) N.Oyabu, O.Custance, I.Yi, Y.Sugawara and
S.Morita: "Mechanical Vertical Manipulation of
Selected Single Atoms by Soft Nanoindentation
Using Near Contact Atomic Force Microscopy",
Phys. Rev. Lett., Vol.90, No.17,
(2003)176102-1-4.
117) K.Okamoto, K.Yoshimoto, Y.Sugawara, and
S.Morita: "KPFM Imaging of Si(111)5γ3x5γ3-Sb
Surface for Atom Distinction Using
NC-AFM",
Appl. Surf. Sci., Vol.210, No.1-2
(2003) pp.128-133.
116) R.Nishi, S.Araragi, K.Shirai, Y.Sugawara
and S.Morita: "Atom Selective Imaging by NC-AFM:
Case of Oxygen Adsorbed on a Si(111)7x7 Surface",
Appl. Surf. Sci., Vol.210, No.1-2 (2003)
pp.90-92.
2002
115) S.Morita and Y.Sugawara: "Atomically
Resolved Imaging of Si(100) 2x1, 2x1:H, 1x1:2H
Surfaces with Noncontact Atomic Force
Microscopy",
Jpn.J.Appl.Phys., Vol.41, Pat.1,
No.7B (2002) pp.4857-4862.
114) S.Araragi, A.Yoshimoto, N.Nakata,
Y.Sugawara and S.Morota: "Atomic Resolution
Imaging of Si(100)1x1:2H Dihydride Surface with
Noncontact Atomic Force Microscopy
(NC-AFM)",
Appl.Sur.Sci., Vol.188, No.3-4
(2002) pp.272-278.
113) T.Uozumi, Y.Tomiyoshi, N.Suehira,
Y.Sugawara and S.Morita: "Observation of Si(100)
Surface with Noncontact Atomic Force Microscope at
5K",
Appl.Sur.Sci., Vol.188, No.3-4 (2002)
pp.279-284.
112) Y.Sugawara, Y.Sano, N. Suehira and
S.Morita: "Atom Manipulation and Image Artifact on
Si(111)7~7 Surface Using a Low Temperature
Noncontact Atomic Force Microscope
",
Appl.Sur.Sci., Vol.188, No.3-4 (2002)
pp.285-291.
111) K.Okamoto, Y.Sugawara and S.Morita: "The
Elimination of the 'Artifact' in the Electrostatic
Force Measurement Using a Novel Noncontact Atomic
Force Microscope/Electrostatic Force
Microscope",
Appl.Sur.Sci., Vol.188, No.3-4
(2002) pp.381-385.
110) S.Morita and Y.Sugawara: "Mapping and
Control of Atomic Force on Si(111)γ3xγ3-Ag Surface
Using Noncontact Atomic Force
Microscope",
Ultramicroscopy, Vol.91, No.1-4
(2002) pp.89-96.
2001
109) S.Morita and Y.Sugawara: "Microscopic
Contact Charging and Dissipation",
Thin Solid
Film, Vol.393 (2001) pp.310-318.
108) M.Komiyama, T.Uchihashi, Y.Sugawara and
S.Morita: "Molecular Orbital Interpretation of
Thymine/Graphite nc-AFM Images",
Surface and
Interface Analysis, Vol.32, (2001) pp.53-56.
107) N.Suehira, Y.Tomiyoshi, Y.Sugawara and
S.Morita: "Low Temperature Noncontact Atomic Force
Microscope with Quick Sample and cantilever
Exchange Mechanism",
Rev. Sci. Instrum.,
Vol.72, No.7, (2001) pp.2971-2976.
106) M.Ashino, Y.Sugawara, S.Morita and
M.Ishikawa: "Atomic Resolution Noncontact Atomic
Force and Scanning Tunneling Microscopy of
TiO2(110)-(1x1) and -(1x2):
Simultaneous Imaging of Surface Structures and
Electronic States",
Phys.Rev.Lett., Vol.86,
No.19, (2001) pp.4334-4337.
105) R.Nishi, I.Houda, K.Kitano, Y.Sugawara and
S.Morita: "Non-contact Atomic Force Microscope in
Air with Quartz Resonator Using FM Detection
Method",
Appl. Phys. A, Vol.72 (2001)
pp.S93-S95.
104) Y.Sugawara, S.Orisaka, E.Hidaka and
S.Morita: "Noncontact AFM Imaging on Si(111)
2~1-Sb Surface with Occupied Lone-Pair
Orbitals",
Appl. Phys. A, Vol.72 (2001)
pp.S11-S14. (Invited paper)
103) N.Suehira, Y.Sugawara and S.Morita:
"Artifact and Fact of Si(111)7x7 Surface Observed
with a Low Temperature Noncontact Atomic Force
Microscope (LT-NC-AFM)",
Jpn. J. Appl. Phys.,
Vol.40, No.3B (2001) pp.L292-L294.
2000
102) S.Morita, Y.Sugawara, K.Yokoyama and
T.Uchihashi: "Correlation of Frequency Shift
Discontinuity to Atomic Position on a
Si(111)7x7Surface by Non-Contact Atomic Force
Microscopy",
Nanotechnology, Vol.11 (2000)
pp.120-123.
101) S.Fujiwaswa, K.Yokoyama, Y.Sugawara and
S.Morita: "Load Dependence of Sticking-Domain
Distribution in Two-Dimensional Atomic Scale
Friction on NaF(100) Surface",
Tribology Lett.,
Vol.9 (2000) pp.69-72.
100) M.Ashino, T.Uchihashi, K.Yokoyama,
Y.Sugawara, S.Morita and M.Ishikawa:
"Atom-Resolved Images of Defect-Induced Structure
on Non-stoichiometric TiO2 Surface by
STM and Noncontact AFM",
Phys.Rev.B, Vol.61,
No.20 (2000) pp.13955-13959.
99) T.Uchihashi, N.Choi, M.Tanigawa, M.Ashino,
Y.Sugawara, H.Nishijima, S.Akita,Y.Nakayama,
H.Tokumoto, K.Yokoyama,S.Morita andM.Ishikawa:
"Carbon-Nanotube Tip for the Highly-Reproducible
Imaging of DNA Helical Turns by Noncontact
AFM",
Jpn.J.Appl.Phys., Vol.39, No.8B (2000)
pp.L887-L889.
98) M.Ashino, T.Uchihashi, K.Yokoyama,
Y.Sugawara, S.Morita and M.Ishikawa: "Structures
of an Oxygen-Deficient TiO2(110)
Studied by Noncontact Atomic Force
Microscopy",
Jpn.J.Appl.Phys., Vol.39, No.6B
(2000) pp.3765-3768.
97) N.Suehira, K.Sugiyama, S.Watanabe, T.Fujii,
Y.Sugawara and S.Morita: "Development of
Low-Temperature Ultrahigh-Vacuum Noncontact Atomic
Force Microscopy with PZT-lever and Scanning
Tunneling Microscope",
Appl.Sur.Sci. ,Vol.157,
No.4 (2000) pp.343-348.
96) R.Nishi, I.Houda, T.Aramata, Y.Sugawara and
S.Morita: "Phase change Detection of Attractive
Force Gradient by Using a Quartz Resonator in
Noncontact Atomic Force
Microscopy",
Appl.Sur.Sci., Vol.157, No.4
(2000) pp. 332-336.
95) T.Uchihashi, M.Ashino, T. Ishida,
Y.Sugawara, M.Komiyama, W.Mizutani, Y.Yokoyama,
S.Morita, H.Tokumoto and M.Ishikawa: "High
Resolution Imaging of Organic Monolayers Using
Noncontact AFM",
Appl.Sur.Sci., Vol.157, No.4
(2000) pp.244-250.
94) Y.Sugawara, S.Orisaka and S.Morita:
"Noncontact AFM Imaging on Al-adsorbed Si(111)
Surface with an Empty Orbital",
Appl.Sur.Sci.,
Vol.157, No.4 (2000) pp.239-243.
93) M.Ashino, T.Uchihashi, K.Yokoyama,
Y.Sugawara, S.Morita, and M.Ishikawa:
"Atomic-Scale Structures on a Non-Stoichiometric
TiO2(110) Surface Studied by Noncontact
AFM",
Appl.Sur.Sci., Vol.157, No.4 (2000)
pp.212-217.
92) T.Uchihashi, M.Tanigawa, M.Ashino,
Y.Sugawara, K.Yokoyama, S.Morita and M.Ishikawa:
"Identification of B-form DNA in an Ultrahigh
Vacuum by Noncontact-mode Atomic Force
Microscopy",
Langmuir, Vol.16, No.3 (2000)
pp.1349-1353.
91) S.Morita, M.Abe, K.Yokoyama and Y.Sugawara;
"Defects and their Charge Imaging on Semiconductor
Surfaces by Noncontact Atomic Force Microscopy and
Spectroscopy",
J.Cryst.Growth, Vol.210 (2000)
pp.408-415.
90) K.Yokoyama, T.Ochi, A.Yoshimoto,
Y.Sugawara, S.Morita: "Atomic Resolution Imaging
on Si(100)2x1 and Si(100)2x1-H Surfaces Using a
Noncontact Atomic Force Microscope",
Jpn.J.Appl.Phys., Vol.39, No.2A (2000)
pp.L113-L115.
89) K.Yokoyama, T.Ochi, T.Uchihashi, M.Ashino,
Y.Sugawara, N.Suehira and S.Morita: "Optical Beam
Deflection Noncontact Atomic Force Microscope
Optimized with Three-Dimensional Beam Adjustment
Mechanism",
Rev.Sci.Instru., Vol.71, No.1
(2000) pp.128-132.
1999
88) K.Yokoyama, T.Ochi, Y.Sugawara and
S.Morita: "Atomically Resolved Ag Imaging on
Si(111)γ3γ3-Ag Surface with Noncontact Atomic
Force Microscope",
Phys.Rev.Lett., Vol.83,
No.24 (1999) pp.5023-5026.
87) S.Morita, Y.Sugawara, S.Orisaka and
T.Uchihashi: "Missing Ag Atom on Si(111)γ3γ3-Ag
Surface Observed by Noncontact Atomic Force
Microscope",
Jpn.J.Appl.Phys., Vol.38, No.11B
(1999) pp.L1342-L1344.
86) T.Uchihashi, Y.Sugawara, K.Yokoyama,
S.Morita and T.Okada: "Self-Assembled Monolayer of
Adenine Base on Graphite Studied by Noncontact
Atomic Force Microscopy",
Phys.Rev.B, Vol.60,
No.11 (1999) pp.8309-8313.
85) Y.Sugawara, T.Minobe, S.Orisaka,
T.Uchihashi, T.Tsukamoto and S.Morita:
"Non-contact AFM Images Measured on
Si(111)γ3γ3-Ag and Ag(111) Surfaces",
Surface
and Interface Analysis, Vol.27, No.5-6 (1999)
pp.456-461.
84) S.Morita and Y.Sugawara; "Guidelines for
the Achievement of True Atomic Resolution with
Noncontact Atomic Force
Microscopy",
Appl.Sur.Sci., Vol.140, No.3-4
(1999) pp.406-410.
83) M.Abe, Y.Sugawara, K.Sawada, Y.Andoh and
S.Morita: "Near-field Optical Imaging Using Force
Detection with New Tip-Electrode
Geometry",
Appl.Sur.Sci., Vol.140, No.3-4
(1999) pp.383-387.
82) Y.Sugawara, T.Uchihashi, M.Abe and
S.Morita: "True Atomic Resolution Imaging of
Surface Structure and Surface Charge on the
GaAs(110)",
Appl.Sur.Sci., Vol.140, No.3-4
(1999) pp.371-375.
81) T.Uchihashi, Y.Sugawara, T.Tsukamoto,
T.Minobe, S.Orisaka T.Okada and S.Morita: "Imaging
of Chemical Reactivity and Buckled Dimers on
Si(100) 2~1 Reconstructed Surface with Noncontact
AFM ",
Appl.Sur.Sci., Vol.140, No.3-4 (1999)
pp.304-308.
80) T.Minobe, T.Uchihashi, T.Tsukamoto,
S.Orisaka, Y.Sugawara and S.Morita: "Distance
Dependence of Noncontact AFM Image Contrast on
Si(111)γ3γ3-Ag Structure",
Appl.Sur.Sci.,
Vol.140, No.3-4 (1999) pp.298-303.
79) S.Orisaka, T.Minobe, Y.Sugawara and
S.Morita: "The Atomic Resolution Imaging of
Metallic Ag(111) Surface by Noncontact Atomic
Force Microscope",
Appl.Sur.Sci., Vol.140,
No.3-4 (1999) pp. 243-246.
1998
78) M.Abe, Y.Sugawara, Y.Hara, K.Sawada and
S.Morita: "Optical Near-Field Imaging Using the
Kelvin Probe Technique",
Jpn.J.Appl.Phys.,
Vol.37, No.9A/B (1998) pp.L1074-L1077.
77) S.Fujisawa, K.Yokoyama, Y.Sugawara and
S.Morita: "Analysis of experimental load
dependence of two-dimensional atomic-scale
friction",
Phys.Rev. B, Vol.58, No.8 (1998)
pp.4909-4916.
76) N.Sasaki, M.Tsukada, S.Fujisawa, Y.Sugawara
and S.Morita: "Theoretical analysis of
atomic-scale friction in frictional-force
microscopy",
Tribology Lett., Vol.4 (1998)
pp.125-128.
75) R.Nishi, Y.Nakao, T.Ohta, Y.Sugawara,
S.Morita and T.Okada: "New computed tomography
algorithm of electrostatic force microscopy based
on the singular value decomposition combined with
the discrete Fourier
transform",
Jpn.J.Appl.Phys., Vol.37, No.4A
(1998) pp.L417-L419.
74) H.Ueyama, Y.Sugawara and S.Morita: "Stable
operation mode for dynamic noncontact atomic force
microscopy",
Appl.Phys. A, Vol.66 (1998)
pp.S295-S297.
73) N.Sasaki, M.Tsukada, S.Fujisawa,
Y.Sugawara, S.Morita and K.Kobayashi: "Load
dependence of the frictional-force microscopy
image pattern of the graphite
surface",
Phys.Rev. B, Vol. 57, No. 7 (1998)
pp.3785-3786.
72) M.Abe, Y.Sugawara, Y.Hara, K.Sawada and
S.Morita: "Force Imaging of Optical Near-Field
Using Noncontact Mode Atomic Force
Microscopy",
Jpn.J.Appl.Phys., Vol. 37, No.2A
(1998) pp.L167-L169.
1997
71) R.Nishi, T.Ohta, Y.Sugawara, S.Morita and
T.Okada: "Simulated Computed Tomography for
Reconstruction of Vacancies from Atomic Force
Microscope Image",
Jpn.J.Appl.Phys., Vol. 36,
No.10B (1997) pp.L1410-L1412.
70) T.Uchihashi, Y.Sugawara, T.Tsukamoto,
M.Ohta and S.Morita: "Role of a covalent bonding
interaction in noncontact-mode atomic-force
microscopy on Si(111)7~7 surface",
Phys.Rev. B,
Vol.56, No.16 (1997) pp.9834-9840.
69) J.Ohgami, Y.Sugawara, S.Morita and T.Ozaki:
"Growth of Two-Dimensional Nucleus on a Cleaved
(010) Surface of
(NH2CH2COOH)3₯H2SO4",
J.Phys.Soc.Jpn.,
Vol.66, No.9 (1997) pp.2747-2750.
68) N.Sasaki, M.Tsukada, S.Fujisawa,
Y.Sugawara, S.Morita and K.Kobayashi: "Analysis of
frictional-force image patterns of a graphite
surface"
J.Vac.Sci.Technol.B, Vol.15, No.4
(1997) pp.1479-1482.
67) M.Abe, T.Uchihashi, M.Ohta, M.Ohta,
H.Ueyama, Y.Sugawara and S.Morita: "Detection
mechanism of optical evanescent field using a
noncontact mode Atomic force microscope with a
frequency modulation detection
method"
J.Vac.Sci.Technol.B, Vol.15, No.4
(1997) pp.1512-1515.
66) T.Uchihashi, M.Ohta, Y.Sugawara, Y.Yanase,
T.Shigematsu, M.Suzuki and S.Morita: "Development
of ultrahigh vacuum atomic force microscopy with
frequency modulation detection and its application
to electrostatic force
measurement"
J.Vac.Sci.Technol.B, Vol.15, No.4
(1997) pp.1543-1546.
65) T.Uchihashi, A.Nakano, T.Ida, Y.Ando,
R.Kaneko Y.Sugawara and S.Morita; "Charge
Dissipation on Chemically Treated Thin Silicon
Oxide in Air",
Jpn.J.Appl.Phys., Vol.36, Part
I, No.6A (1997) pp.3755-3758.
64) M.Abe, T.Uchihashi, M.Ohta, H.Ueyama,
Y.Sugawara and S.Morita: "Measurement of the
Evanescent Field Using Noncontact Mode Atomic
Force Microscope",
Opt. Rev., Vol.4, No.1B
(1997) pp.232-235.
63) Y.Sugawara, H.Ueyama, T.Uchihashi, M.Ohta,
S.Morita, M.Suzuki and S.Mishima: "True atomic
resolution imaging with noncontact atomic force
microscopy",
Appl.Sur.Sci., Vol.113/114 (1997)
pp.364-370 (Invited Paper).
1996
62) S.Morita, T.Uchihashi, T.Okusako,
Y.Yamanishi and T.Oasa and Y.Sugawara; "Stability
of Densely Contact-Electrified Charges on Thin
Silicon Oxide in Air ",
Jpn.J.Appl.Phys.,
Vol.35, Part 1, No.11 (1996) pp.5811-5814.
61) T.Ohta, Y.Sugawara and S.Morita:
"Feasibility Study on a Novel Type of Computerized
Tomography Based on Scanning Probe Microscope
",
Jpn.J.Appl.Phys., Vol.35, Part 2, No.9B
(1996) pp.L1222-L1224.
60) S.Morita, S.Fujisawa, E.Kishi, M.Ohta,
H.Ueyama and Y.Sugawara: "Contact and noncontact
mode imaging by atomic force microscopy",
Thin
Solid Film, Vol.273 (1996) pp.138-142.
59) J.Ohgami, Y.Sugawara, S.Morita, E.Nakamura
and T.Ozaki: "Time Evolution of Surface Topography
around a Domain Wall in Ferroelectric
(NH2CH2COOH)3₯H2SO4",
Jpn.J.Appl.Phys., Vol.35,
Part 1, No.9B (1996) pp.5174-5177.
58) Y.Sugawara, T.Tsuyuguchi, T.Uchihashi,
T.Okusako, Y.Fukano, Y.Yamanishi, T.Oasa and
S.Morita,; "Density saturation of densely
contact-electrified negative charges on a thin
silicon oxide sample due to the Coulomb repulsive
force",
Philos. Mag. A, Vol.74, No.5 (1996)
pp.1339-1346.
57) S.Fujisawa, Y.Sugawara and S.Morita: "Load
dependence of the periodicity in friction force
images on the NaF(100) surface",
Philos. Mag.
A, Vol.74, No.5 (1996) pp.1329-1337.
56) J.Ohgami, Y.Sugawara, S.Morita, E.Nakamura
and T.Ozaki: "Determination of Sign of Surface
Charges of Ferroelectric TGS Using Electrostatic
Force Microscope Combined with the Voltage
Modulation Technique",
Jpn.J.Appl.Phys.,
Vol.35, Part 1, No.5A (1996) pp.2734-2739.
55) S.Fujisawa, Y.Sugawara and S.Morita:
"Localized Fluctuation of a Two-Dimensional
Atomic-Scale Friction",
Jpn.J.Appl.Phys.,
Vol.35, Part 1, No.11 (1996) pp.5909-5913.
54) Y.Fukano, Y.Sugawara, T.Uchihashi,
T.Okusako, S.Morita, Y.Yamanishi and T.Oasa;
"Phase Transition of Contact-Electrified Negative
Charges on a Thin Silicon Oxide in
Air",
Jpn.J.Appl.Phys., Vol.35, Part 1, No.4A
(1996) pp.2394-2401.
53) Y.Sugawara, M.Ohta, H.Ueyama, S.Morita,
F.Osaka, S.Ohkouchi, M.Suzuki and S.Mishima:
"Atomic resolution Imaging of InP(110) surface
observed with ultrahigh vacuum atomic force
microscope in noncontact
mode",
J.Vac.Sci.Technol.B, Vol.14, No.2 (1996)
pp.953-956.
52) T.Uchihashi, T.Okusako, Y.Sugawara,
Y.Yamanishi, T.Oasa and S.Morita; "Correlation
between contact-electrified charge groups on a
thin silicon oxide",
J.Vac.Sci.Technol.B,
Vol.14, No.2 (1996) pp.1055-1059.
51) T.Uchihashi, T.Okusako, Y.Sugawara,
Y.Yamanishi, T.Oasa and S.Morita; "Proximity
effects of negative charge groups
contact-electrified on thin silicon oxide in
air",
J.Appl.Phys., Vol.79, No.8 (1996)
pp.4174-4177.
50) S.Morita, S.Fujisawa and Y.Sugawara:
"Spatially quantized friction with a lattice
periodicity",
Surface Science Reports, Vol.23,
No.1 (1996) pp.1-42.
1995
49) M.Ohta, H.Ueyama, Y.Sugawara and S.Morita:
"Contrast of Atomic-Resolution Images from a
Noncontact Ultrahigh-Vacuum Atomic Force
Microscope",
Jpn.J.Appl.Phys., Vol.34, Part 2,
No.12B (1995) pp.L1692-L1694.
48) Y.Sugawara, M.Ohta, H.Ueyama and S.Morita:
"Defect Motion on an InP(110) Surface Observed
with Noncontact Atomic Force
Microscopy",
Science, Vol.270 (1995)
pp.1646-1648.
47) H.Ueyama, M.Ohta, Y.Sugawara and S.Morita:
"Atomically Resolved InP(110) Surface Observed
with Noncontact Ultrahigh Vacuum Atomic Force
Microscope",
Jpn.J.Appl.Phys., Vol.34, Part 2,
No.8B (1995) pp.L1086-L1088.
46) S.Fujisawa, E.Kishi, Y.Sugawara and
S.Morita: "Two-dimensional quantized friction
observed with two-dimensional frictional force
microscope",
Tribology Lett., Vol.1 (1995)
pp.121-127.
45) S.Fujisawa, E.Kishi, Y.Sugawara and
S.Morita: "Load dependence of two-dimensionally
atomic-scale friction",
Phys.Rev.B, Vol.52,
No.7 (1995) pp.5302-5305.
44) S.Fujisawa, E.Kishi, Y.Sugawara and
S.Morita: "Two-dimensionally discrete friction on
NaF(100) surface with the lattice
periodicity",
Nanotechnology, Vol.5 (1995)
pp.8-11.
43) M.Ohta, Y.Sugawara, F.Osaka, S.Ohkouchi,
M.Suzuki, S.Mishima, T.Okada and S.Morita:
"Atomically Resolved Image of Cleaved Surface of
Compound Semiconductors Observed with an Ultrahigh
Vacuum Atomic Force
Microscope",
J.Vac.Sci.Technol.B, Vol.13, No.3
(1995) pp.1265-1267.
42) S.Fujisawa, E.Kishi, Y.Sugawara and
S.Morita: "Atomic-scale friction observed with
two-dimensional frictional force
microscope",
Phys.Rev.B, Vol.51, No.12 (1995)
pp.7849-7857.
41) Y.Sugawara, M.Ohta, H.Ueyama and S.Morita:
"Atomic-Resolution Image of ZnSSe(110) Surface
with an Ultrahigh-Vacuum Atomic Force Microscope
(UHV-AFM)",
Jpn.J.Appl.Phys., Vol.34, No.4A
(1995) pp.L462-464.
40) S.Fujisawa, E.Kishi, Y.Sugawara and
S.Morita: "Lateral force curve for atomic
force/lateral force microscope
calibration",
Appl.Phys.Lett., Vol.66, No.4
(1995) pp.526-528.
1994
39) Y.Fukano, T.Uchihashi, T.Okusako,
A.Chayahara, Y.Sugawara, Y.Yamanishi, T.Oasa and
S.Morita; "Parameter Dependence of Stable State of
Densely Contact-Electrified Electrons on Thin
Silicon Oxide",
Jpn.J.Appl.Phys., Vol.33,
Part.1, No.12A (1994) pp.6739-6745.
38) T.Uchihashi, Y.Fukano, Y.Sugawara,
S.Morita, A.Nakano, T.Ida and T.Okada;
"Potentiometry Combined with Atomic Force
Microscope",
Jpn.J.Appl.Phys., Vol.33, Part.2,
No.11A (1994) pp.L1562-L1564.
37) T.Uchihashi, T.Okusako, T.Tsuyuguchi,
Y.Sugawara, M.Igarashi, R.Kaneko and S.Morita:
"Charge Storage on Thin SrTiO3 Film by
Contact Electrification",
Jpn.J.Appl.Phys.,
Vol.33, Part.1, No.9B (1994) pp.5573-5576.
36) M.Ohta, Y.Sugawara, S.Morita, H.Nagaoka,
S.Mishima and T.Okada; "Ultrahigh vacuum atomic
force microscope with sample cleaving
mechanism",
J.Vac.Sci.Technol.B, Vol.12, No.3
(1994) pp.1705-1707.
35) S.Fujisawa, Y.Sugawara, S.Morita, S.Ito,
S.Mishima and T.Okada; "Study on the stick-slip
phenomenon on a cleaved surface of the Muscovite
mica using an atomic force /lateral force
microscope",
J.Vac.Sci.Technol.B, Vol.12, No.3
(1994) pp.1635-1637.
34) Y.Sugawara, Y.Fukano, T.Uchihashi,
S.Morita, Y.Yamanishi, T.Oasa and T.Okada; "Atomic
force microscopy studies of contact-electrified
charges on silicon oxide
film",
J.Vac.Sci.Technol.B, Vol.12, No.3 (1994)
pp.1627-1630.
33) T.Uchihashi, T.Okusako, Y.Sugawara,
Y.Yamanashi, T.Oasa and S,Morita; "Heat Treatment
and Steaming Effects of Silicon Oxide upon
Electron Dissipation on Silicon Oxide
Surface",
Jpn.J.Appl.Phys., Vol.33, No.8A
(1994) pp.L1128-L1130.
32) T.Okusako, T.Uchihashi, A.Nakano, T.Ida,
Y.Sugawara, and S.Morita; "Dissipation of Contact
Electrified Electrons on Dielectric Thin Films
with Silicon Substrate",
Jpn.J.Appl.Phys.
Vol.33, No.7A (1994) pp.L959-L961.
31) T.Tsuyuguchi, T.Uchihashi, T.Okusako,
Y.Sugawara, S.Morita, Y.Yamanishi and T.Oasa;
"Contact Electrification on Thin Silicon Oxide in
a Vacuum",
Jpn.J.Appl.Phys., Vol.33, No.7B
(1994) pp.L1046-L1048.
30) Y.Fukano, T.Uchihashi, T.Okusako,
A.Chayahara, Y.Sugawara, Y.Yamanishi, T.Oasa and
S.Morita; "Time Evolution of Contact-Electrified
Electron Dissipation on Silicon Oxide Surface
Investigated Using Noncontact Atomic Force
Microscope",
Jpn.J.Appl.Phys., Vol.33, Part 1,
No.1B (1994) pp.379-382.
29) Y.Fukano, K.Hontani, Y.Uchihashi,
T.Okusako, A.Chayahara, Y.Sugawara, Y.Yamanishi,
T.Oasa and S.Morita; "Time Dependent Dielectric
Breakdown of Thin Silicon Oxide Using Dense
Contact Electrification",
Jpn.J.Appl.Phys.
Vol.33, Part.1, No.6B (1994) pp.3756-3760.
28) S.Fujisawa, E.Kish, Y.Sugawara and
S.Morita; "Fluctuation in Two-Dimensional
Stick-Slip Phenomenon Observed with
Two-Dimensional Frictional Force
Microscope",
Jpn.J.Appl.Phys. Vol.33, Part.1,
No.6B (1994) pp.3752-3755.
27) Y.Sugawara, M.Ohta, K.Hontani, S.Morita,
F.Osaka, S.Ohkouchi, M.Suzuki, H.Nagaoka,
S.Mishima and T.Okada; "Observation of GaAs(110)
Surface by an Ultrahigh-Vacuum Atomic Force
Microscope",
Jpn.J.Appl.Phys., Vol.33, Part.1,
No.6B (1994) pp.3739-3742.
26) T.Uchihashi, T.Okusako, J.Yamada, Y.Fukano,
Y.Sugawara, M.Igarashi, R.Kaneko and S.Morita;
"Contact Electrification on Thin SrTiO3 Film by
Atomic Force Microscope",
Jpn.J.Appl.Phys.,
Vol.33, No.3A (1994) pp.L374-L376.
25) S.Morita, Y.Fukano, T.Uchihashi,
Y.Sugawara, Y.Yamanishi and T.Oasa; "Dissipation
of contact-electrified charge on thin Si-oxide
studied by atomic force microscope",
Applied
Surface Science, Vol.75 (1994) pp.151-156.
24) S.Fujisawa, M.Ohta, T.Konishi, Y.Sugawara
and S.Morita; "Difference between the forces
measured by an optical lever deflection and by an
optical interferometer in atomic force
microscope",
Rev. of Scientific Instruments,
Vol.65, No.3, March (1994) pp.644-647.
23) Y.Sugawara, S.Morita, Y.Fukano,
T.Uchihashi, T.Okusako, A.Chayahara, Y.Yamanishi
and T.Oasa; "Spatial distribution of densely
contact-electrified charges on a thin silicon
oxide",
Jpn.J.Appl.Phys., Vol.33, No.1A (1994)
pp.L74-L77.
22) Y.Sugawara, S.Morita, Y.Fukano,
T.Uchihashi, T.Okusako, A.Chayahara, Y.Yamanishi
and T.Oasa; "Spatial distribution and its phase
transition of densely contact-electrified
electrons on a thin silicon
oxide",
Jpn.J.Appl.Phys., Vol.33, No.1A (1994)
pp.L70-L73.
21) M.Ohta, Y.Sugawara, K.Hontani, S.Morita,
F.Osaka, M.Suzuki, H.Nagaoka, S.Mishima and
T.Okada; "Atomically Resolved Image of Cleaved
GaAs(110) Surface Observed with an Ultrahigh
Vacuum Atomic Force
Microscope",
Jpn.J.Appl.Phys., Vol.33, No.1A
(1994) pp.L52-L54.
1993
20) S.Fujisawa, Y.Sugawara and S.Morita:
"Origin of the Force Measured by an Atomic
Force/Lateral Force Microscope
(AFM/LFM)",
Microbeam Analysis, Vol.2 (1993)
pp.311-316.
19) S.Fujisawa, Y.Sugawara, S.Itoh, S.Mishima,
T.Okada and S.Morita: "Two-dimensional stick-slip
phenomenon with atomic
resolution",
Nanotechnology, Vol.4, No.3 (1993)
pp.138-142.
18) S.Morita, Y.Sugawara, Y.Fukano,
T.Uchihashi, T.Okusako, A.Chayahara, Y.Yamanishi
and T.Oasa: "Stable-unstable phase transition of
densely contact-electrified electrons on a thin
silicon oxide",
Jpn.J.Appl.Phys., Vol.32,
No.12B (1993) pp.L1852-L1854.
17) S.Morita, Y.Fukano, T.Uchihashi, T.Okusako,
Y.Sugawara, Y.Yamanishi and T.Oasa: "Reproducible
and Controllable Contact Electrification on a Thin
Insulator",
Jpn.J.Appl.Phys., Vol.32, No.11B
(1993) pp.L1701-L1703.
16) Y.Sugawara, M.Ohta, T.Konishi, S.Morita,
M.Suzuki and Y.Enomoto: "Effects of humidity and
tip radius on the adhesive force measured with
atomic force microscopy",
Wear, Vol.168 (1993)
pp.13~16.
15) S.Morita, Y.Sugawara and Y.Fukano: "Atomic
Force Microscope Combined with Scanning Tunneling
Microscope [AFM/STM]",
Jpn.J.Appl.Phys.,
Vol.32, Part 1, No.6B (1993) pp.2983-2988.
14) M.Ohta, T.Konishi, Y.Sugawara, S.Morita,
M.Suzuki and Y.Enomoto: "Observation of atomic
defect on LiF(100) surface with UHV
AFM",
Jpn.J.Appl.Phys., Vol.32, Part 1, No.6B
(1993) pp.2980-2982.
13) Y.Fukano, Y.Sugawara, Y.Yamanishi, T.Oasa
and S.Morita; "Scanning Force / Tunneling
Microscopy as a Novel Technique for the Study of
Nanometer-Scale Dielectric Breakdown of Silicon
Oxide Layer",
Jpn.J.Appl.Phys., Vol.32, Part 1,
No.1B (1993) pp.290-293.
1992
12) Y.Sugawara, Y.Fukano, Y.Kamihara, S.Morita,
A.Nakano, T.Ida and R.Kaneko; "AFM/STM
investigation of polycrystalline Si
surface",
Ultramicroscopy, Vol.42-44 (1992)
pp.1372-1375.
11) Y.Sugawara, Y.Fukano, A.Nakano, T.Ida and
S.Morita; "Oxidation Site of Polycrystalline
Silicon Surface Studied Using Scanning
Force/Tunneling Microscope (AFM/STM) in
Air",
Jpn.J.Appl.Phys.,Vol.31, Part2, No.6A
(1992) pp.L725-L727.
1991
10) K.Endo, Y.Sugawara, S.Mishima, T.Okada and
S.Morita; "In Situ Imaging of Electrochemical
Deposition of Ag on Au(111)",
Jpn.J.Appl.Phys.,
Vol.30, No.10 (1991) pp.2592-2593.
9) Y.Sugawara, T.Ishizaka and S.Morita;
"Scanning force/tunneling microscopy of a graphite
surface in air",
J.Vac.Sci.Technol.B, Vol.9,
No.2 (1991) pp.1092-1095.
1990
8) Y.Sugawara, T.Ishizaka and S.Morita; "Origin
of Anomalous Corrugation Height of STM Images of
Graphite",
Jpn.J.Appl.Phys., Vol.29, No.8
(1990) pp.1533-1538.
7) Y.Sugawara, T.Ishizaka and S.Morita;
"Simultaneous Imaging of a Graphite Surface with
Atomic Force/Scanning Tunneling Microscope
(AFM/STM)",
Jpn.J.Appl.Phys., Vol.29, No.8
(1990) pp.1539-1543.
6) T.Ishizaka, Y.Sugawara, K.Kumagai and
S.Morita; "Anomalous Force Dependence of AFM
Corrugation Height of a Graphite Surface in
Air",
Jpn.J.Appl.Phys. Vol.29, No.7 (1990)
pp.L1196-L1198.
5) Y.Sugawara, T.Ishizaka, S.Morita, S.Imai and
N.Mikoshiba; "Anomalous Corrugation Height of
Atomically Resolved AFM Images of a Graphite
Surface",
Jpn.J.Appl.Phys., Vol.29, No.3 (1990)
pp.L502-L504.
4) Y.Sugawara, T.Ishizaka, S.Morita, S.Imai and
N.Mikoshiba; "Simultaneous Observation of
Atomically Resolved AFM/STM Images of a Graphite
Surface",
Jpn.J.Appl.Phys., Vol.29, No.1 (1990)
pp.L157-L159.
3) T.Ishizaka, S.Morita, Y.Sugawara, T.Okada,
S.Mishima, S.Imai and N.Mikoshiba; "Surface
Imaging in Air with a Force
Microscope",
J.Vac.Sci.Technol.A, Vol.8, No.1
(1990) pp.391-393.
2) A.Yagi, S.Tsukada, Y.Takahashi, Y.Sugawara,
S.Morita, T.Okada, S.Imai and N.Mikoshiba;
"Differential Conductance Imaging under AC
Tunneling Bias",
J.Vac.Sci.Technol.A, Vol.8,
No.1 (1990) pp.336-338.
1989
1) S.Morita, T.Ishizaka, Y.Sugawara, T.Okada,
S.Mishima, S.Imai and N.Mikoshiba;"Surface
Conductance of Metal Surfaces in Air Studied with
a Force Microscope",
Jpn.J.Appl.Phys., Vol.28,
No.9 (1989) pp.L1634-L1636.
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