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論文・著書

2018▼

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paper 2018 （11）

      1. H. F. Wen, M. Miyazaki, Q. Zhang, Y. Adachi, Y. J. Li and Y. Sugawara
        “Direct observation of atomic step edges on the rutile TiO2(110)-(1X1) surface using atomic force microscopy”
        Phys. Chem. Chem. Phys., 20, (2018) 28331-28337.
        DOI: 10.1039/c8cp06156d : PDF
      2. H. F. Wen, Q. Zhang, Y. Adachi, M. Miyazaki, Y. Naitoh, Y. J. Li and Y. Sugawara
        “Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy”
        The Journal of Physical Chemistry C, 122, (2018) 17395-17399.
        DOI: 10.1021/acs.jpcc.8b06289 : PDF
      3. Y. J. Li, H. F. Wen, Q. Zhang, Y. Adachi, E. Arima, Y. Kinoshita, H. Nomura, Z. M. Ma, L. Kou, Y. Naitoh, Y. Sugawara, R. Xu and Z. H. Cheng
        “Stable Contrast Mode on TiO2(110) Surface with Metal-Coated Tips Using AFM”
        Ultramicroscopy, 191, (2018) 51-55.
        DOI: 10.1016/j.ultramic.2018.04.003 : PDF
      4. E. Arima, H. F. Wen, Y. Naitoh, Y. J. Li and Y. Sugawara
        “KPFM/AFM imaging on TiO2(110) surface in O2 gas”
        Nanotechnology, 29, (2018) 105504(1-8).
        DOI: 10.1088/1361-6528/aaa62c : PDF
      5. Q. Zhang, Y. J. Li, H. F. Wen, Y. Adachi, Y. Sugawara, R. Xu, Z. H. Cheng, J. Brndiar, L. Kantorovich and I. Štich
        “Measurement and Manipulation of the Charge State of Adsorbed Oxygen Adatom on Rutile TiO2(110)-1X1 Surface by nc-AFM and KPFM”
        J. Am. Chem. Soc., 140(46), (2018) 15668-15674.
        DOI: 10.1021/jacs.8b07745 : PDF
      6. J. Yamanishi, Y. Naitoh, Y. J. Li and Y. Sugawara
        “Heterodyne Frequency Modulation Technique in Photoinduced Force Microscopy”
        Phys. Rev. Appl., 9, (2018) 024031(1-5).
        DOI: 10.1103/PhysRevApplied.9.024031 : PDF
      7. L. Lei, R. Xu, S. Ye, X. Wang, K. Xu, S Hussain, Y. J. Li, Y. Sugawara, L. Xie, W. Ji and Z. H. Cheng
        “Local characterization of mobile charge carriers by two electrical AFM modes: multi-harmonic EFM versus sMIM”
        Journal of Physics Communications, 2(2), (2018) 025013(10).
        DOI: 10.1088/2399-6528/aaa85f : PDF
      8. Z. Ma, S. Zhang, Y. Fu, H. Yuan, Y. Shi, J. Gao, L. Qin, J. Tang, J. Liu and Y. J. Li
        “Magnetometry for precision measurement using frequency-modulation microwave combined efficient photon-collection technique on an ensemble of nitrogen vacancy centers in diamond”
        OPTICS EXPRESS, 26(1), (2018) 382-390.
        DOI: 10.1364/OE.26.000382 : PDF
      9. J. Yamanishi, Y. Naitoh, Y. J. Li and Y. Sugawara
        “Heterodyne Frequency Modulation in Photoinduced Force Microscopy”
        Physical review applied, 9, (2018) 024031.
        DOI: 10.1103/PhysRevApplied.9.024031 : PDF
      10. Kinoshita Yukinori,Yoshitaka Naitoh, Yanjun Li, Satoru Yoshimura, Hitoshi Saito and Yasuhiro Sugawara
        “Erratum: Magnetic resonance force microscopy using ferromagnetic resonance of a magnetic tip excited by microwave transmission via a coaxial resonator”
        Nanotechnology, 29(5), 485709 (2018).
        DOI:10.1088/1361-6528/aa9e5a
      11. 李艶君,安達有輝, 宮崎雅大, 張全震, 温煥飛, 内藤賀公, 菅原康弘.
        “ケルビンプローブ力顕微鏡によるルチル型 TiO2 (110) 表面上の吸着酸素分子の電荷状態と電荷操作に関する研究”
        表面と真空, 61(10), 639-644 (2018).
        DOI: 10.1380/vss.61.639

paper 2017 （8）

      1. J. Mu, Z. Qu, Z. Ma, S. Zhang, Y. Shi, J. Gao, X. Zhang, H. Cao, L. Qin, J. Liu and Y. J. Li
        “Ensemble spin fabrication and manipulation of NV centres for magnetic sensing in diamond”
        Sensor Review, 37(4), (2017) 419-424.
        DOI: 10.1108/SR-09-2016-0163 : PDF
      2. R. Turanský, K. Palotás, J. Brndiar, Y. J. Li, Y. Sugawara and I. Štich
        “Subatomic-scale resolution with SPM: Co adatom on p(2×1)Cu(110):O”
        Nanotechnology, 30(9), (2019) 95703(1-7).
        DOI: 10.1088/1361-6528/aaf6dc : PDF
      3. Yukinori Kinoshita, Y. J. Li, Satoru Yoshimura, Hitoshi Saito and Yasuhiro Sugawara
        “Magnetic Resonance force microscopy using ferromagnetic resonance of a magnetic tip excited by microwave transmission via a coaxial resonator”
        Nanotechnology, 28, (2017) 485709.
        DOI: 10.1088/1361-6528/aa90f4 : PDF 
      4. E. Arima, Y. Naitoh, Y. J. Li and Y. Sugawara
        “Separation of Atomic-Scale Spin Contrast on NiO(001) by Magnetic Resonance Force Microscopy”
        Journal of Physics: Condensed Matter, 29(40), (2017) 404001(1-6).
        DOI: 10.1088/1361-648X/aa815d : PDF 
      5. Y. Naitoh, R. Turanský, J. Brndiar, Y. J. Li, I. Štich and Y. Sugawara
        “Subatomic-scale force vector mapping above a Ge(001) dimer using bimodal atomic force microscopy”
        Nature Physics 13, (2017) 663-668.
        DOI: 10.1038/NPHYS4083 : PDF
      6. H. F. Wen, Y. J. Li, E. Arima, Y. Naitoh, Y. Sugawara, R. Xu and Z. H. CHENG
        “Investigation of tunneling current and local contact potential difference on the TiO2(110) surface by AFM/KPFM at 78 K”
        Nanotechnology 28, (2017) 105704 (1-6).
        DOI: 10.1088/1361-6528/aa5aef : PDF
      7. Shaowen Zhang, Zongmin Ma, Li Qin, Yueping Fu, Yunbo Shi, Jun Liu and Yanjun Li
        “Fluorescence detection using optical waveguide collection device with high efficiency on assembly of nitrogen vacancy centers in diamond”
        Applied Physics Express, 11(1), 013007-(1-4) (2017).
        DOI: 10.3390/coatings10010084
著書
      • Y. J. Li, Haunfei Wen, Zong Min Ma, Lili Kou, Yoshitaka Naitoh and Yasuhiro Sugawara
        “Kelvin probe force microscopy with atomic resolution”
        Title of Book/Volume/Conference: Kelvin Probe Force Microscopy – From Single Charge Detection to Device Characterization
        Editor(s) name(s): Dr. Sascha Sadewasser and Dr. Thilo Glatzel
        Springer Series in Surface Sciences
        Springer 8月出版予定,(2017).

paper 2016 （7）

      1. Z. M. Ma, F. Wang, Z. Qu, M. Zhao, Y. B. Shi, S. M. Zhang, L. Qin, J. Liu and Y. J. Li
        “The high precision measurements and instruments with special SPM technique”
        SCIENTIA SINICA Physica, Mechanica & Astronomica, 46 (2016) 11300-(1-6).
        DOI: 10.1021/acs.nanolett.6b03203 : PDF
      2. Y. Kinoshita, R. Turanský, J. Brndiar, Y. Naitoh, Y. J. Li, L. Kantorovich, Y. Sugawara and I. Štich
        “Promoting atoms into delocalized long-living magnetically modified state using Atomic Force Microscopy”
        Nano Lett., 16 (12), (2016) 7490–7494.
        DOI: 10.1021/acs.nanolett.6b03203 : PDF
      3. Eiji Arima, Yoshitaka Naitoh, and Y. J. Li and Yasuhiro Sugawara
        “原子レベルで表面磁性を可視化する強磁性共鳴を用い磁気交換力顕微鏡の開発”
        表面科学37(9), (2016) pp416-421 : PDF
      4. Lili Kou, Y. J. Li, Takeshi Kamijyo, Yoshitaka Naitoh and Yasuhiro Sugawara
        “Investigation of the surface potential of TiO2 (110) by frequency-modulation Kelvin probe force microscopy”
        Nanotechnology 27, (2016) 505704 (1-7).
        DOI: 10.1088/0957-4484/27/50/505704 : PDF
      5. Eiji Arima, Huanfei Wen, Yoshitaka Naitoh, Y. J. Li and Yasuhiro Sugawara
        “Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces”
        Review of scientific instruments 87, (2016) 093113-(1-6).
        DOI: 10.1063/1.4962865 : PDF
      6. Y. J. Li, Seung Hwan Lee, Yukinori Kinoshita, Zong Min Ma, Huanfei Wen, Hikaru Nomura, Yoshitaka Naitoh and Yasuhiro Sugawara
        “Growth Models of Coexisting p(2×1) and c(6×2) Phases on Oxygen-Terminated Cu(110) Surface Studied by Noncontact Atomic Force Microscopy at 78 K”
        Nanotechnology 27, (2016) 205702 (1-7).
        DOI: 10.1088/0957-4484/27/20/205702 : PDF
      7. Junsuke Yamanishi, Takashi Tokuyama, Yoshitaka Naitoh, Y. J. Li and Yasuhiro Sugawara
        “Distance dependence of atomic-resolution near-field imaging on α-Al2O3 (0001) surface with respect to surface photovoltage of silicon probe tip”
        Nano Research 9(2), (2016) 530–536.
        DOI: 10.1007/s12274-015-0934-4 : PDF

paper 2015 （6）

      1. Y. J. Li, J Brndiar, Y Naitoh, Y Sugawara and I Štich
        “Atomic force microscopy identification of Al-sites on ultrathin aluminum oxide film on NiAl(110)”
        Nanotechnology 26 (2015) 505704 (1-5).
        DOI: 10.1088/0957-4484/26/50/50570 : PDF
      2. Yasuhiro Sugawara, Junsuke Yamanishi, Takashi Tokuyama, Yoshitaka Naitoh and Y. J. Li
        “Atomic-Resolution Imaging of the Optical Near Field Based on the Surface Photovoltage of a Silicon Probe Tip”
        Phys. Rev. Applied 3, (2015) 044020(1-6).
        DOI: 10.1103/PhysRevApplied.3.044020 : PDF
      3. Lili Kou, Zongmin Ma, Y. J. Li, Yoshitaka Naitoh, Masahara Komiyama and Yasuhiro Sugawara
        “Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe microscopy without bias voltage feedback”
        Nanotechnology, 26, (2015) 95701 (1-7).
        DOI: 10.1088/0957-4484/26/19/195701 : PDF
      4. Eiji Arima, Yoshitaka Naitoh, Y. J. Li, Satoru Yoshimura, Hitoshi Saito, Hikaru Nomura, Ryoichi Nakatani and Yasuhiro Sugawara
        “Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance”
        Nanotechnology, 26, (2015) 125701 (1-6).
        DOI: 10.1088/0957-4484/26/12/125701 : PDF
      5. H. Zhang, Z. M. Ma, Y. N. Xie, J. Tang, Y. B. Shi, C. Y. Xue, J. Liu and Y. J. Li
        “Development of a Novel Conductive Probe at Atomic Resolution in UHV-AFM”
        Surface Technology, 44(2), (2015) 115-118.
        DOI:10.16490/j.cnki.issn.1001-3660.2015.02.022 : PDF
      6. Z. M. Ma, H. Zhang, Y. N. Xie, J. Tang, Y. B. Shi, C. Y. Xue, J. Liu and Y. J. Li
        “Chemical identification at atomic resolution on Cu(110)-O surface using NC-AFM”
        SCIENTIA SINICA Physica, Mechanica & Astronomica, 45(1), (2015) 017002-(1-6).
        DOI: 10.1360/SSPMA2014-00239 : (PDF download is restricted by the Website)

paper 2014（5）

      1. LI ShengKun, MA ZongMin, ZHANG Huan, XUE Hui, TANG Jun, SHI YunBo, XUE ChenYang, LIU Jun and Y. J. Li
        “Spin observation with ferromagnetic resonance imaging at nano-scale”
        SCIENTIA SINICA Physica, Mechanica & Astronomica, 44(8), (2014) 281-287.
        DOI: 10.1360/SSPMA2014-00012 : (PDF download is restricted by the Website)
      2. J. Bamidele, S.H. Lee, Y. Kinoshita, R. Turanský, Y. Naitoh, Y. J. Li, Y. Sugawara, I. Štich and L. Kantorovich
        “Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism”
        Nature communications 5, (2014) 4476(1-7).
        DOI: 10.1038/ncomms5476 : PDF
      3. J. Bamidele, Y. Kinoshita, R. Turanský, S. H. Lee, Y. Naitoh,  Y. J. Li, Y. Sugawara, I. Štich and L. Kantorovich
        “Image formation and contrast inversion in noncontact atomic force microscopy imaging of oxidized Cu(110) surfaces”
        Phys. Rev. B 90, (2014) 035410-(1-7).
        DOI: 10.1103/PhysRevB.90.035410 : PDF
      4. Ma Zongmin, Mu Jiliang, Tang Jun, Xue Hui, Zhang huan, Xue Chenyang, Liu jun and Y. J. Li
        “Artifacts in KPFM, Am and heterodyne AM modes”
        Key Engineering Materials 609-610, (2014) 1362-1368 : PDF € 32,00 (有料)
      5. Shi Yunbo, Xue Hui, Ma Zongmin, Zhang huan, Tang Jun, Xue Chenyang, Liu jun and Y. J. Li
        “Observation of Ferromagnetic Resonance in Magnetic Exchange Force Microscopy (MExFM)”
        Key Engineering Materials 609-610, (2014) 1392-1397.
        DOI: 10.1103/PhysRevB.90.035410 : PDF € 32,00 (有料)

paper 2013（3）

      1. Xue Hui, Ma Zong-Min, Shi Yun-Bo, Tang Jun, Xue Chen-Yang, Liu Jun and Y. J. Li,
        “Magnetic exchange force microscopy using ferromagnetic resonance”
        Acta Phys. Sin. 62 (18), (2013) 180704 : (5MB PDF file can be downloaded)
      2. Ma Zong-Min, Mu Ji-Liang, Tang Jun, Xue Hui, Zhang Huan, Xue Chen-Yang, Liu Jun and Y. J. Li.
        “Potential sensitivities in Frequency Modulation and Heterodyne Amplitude Modulation Kelvin Probe Force Microscopes”
        Nanoscale Research Letts, 8, (2013) 532-536.
        DOI: 10.1186/1556-276X-8-532 : PDF
      3. Zong Min Ma, Lili Kou, Yoshitaka Naitoh, Y. J. Li and Yasuhiro Sugawara
        “The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes”
        Nanotechnology, 24, (2013) 225701 (1-8).
        DOI: 10.1088/0957-4484/24/22/225701 : PDF

paper 2012（5）

      1. J. Bamidele, Y. J. Li, Samuel Jarvis, Yoshitaka Naitoh, Yasuhiro Sugawara and Lev Kantorovich
        “Complex Design of Dissipation Signals in Non-Contact Atomic Force Microscopy”
        Phys. Chem. Chem. Phys., 14, (2012) 16250-16257.
        DOI: 10.1039/c2cp43121a : PDF
      2. Y. Naitoh, T. Kamijo, Y. J. Li and Y. Sugawara,
        “Quantification of atomic-scale elasticity on Ge(001)-c(4×2) surfaces via noncontact atomic force microscopy with a tungsten-coated tip”
        Phys. Rev. Lett., 109(21), (2012) 215501(1-5).
        DOI: 10.1103/PhysRevLett.109.215501 : PDF
      3. J. Bamidele, Y. Kinoshita, R. Turanský, S. H. Lee, Y. Naitoh, Y. J. Li, Y. Sugawara, I.Štich and L. Kantorovich
        “Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface”
        Phys. Rev. B, 86(15), (2012) 155422 (1-8).
        DOI: 10.1103/PhysRevB.86.155422 : PDF
      4. Y. Sugawara, L-L. Kou, Z-M Ma, T. Kamijo, Y. Naitoh and Y. J. Li
        “High potential sensitivity in heterodyne amplitude modulation Kelvin probe force microscopy”
        Appl. Phys. Lett., 100, (2012) 223104(1-4).
        DOI: 10.1063/1.4723697 : PDF
      5. Y. J. Li, Y. Kinoshita, K. Tenjin, Z. Ma, L. Kou, Y. Naitoh, M. Kageshima and Y. Sugawara
        “Force Mapping of the NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78K”
        Jpn. J. Appl. Phys., 51(3), (2012) 035201(1-5).
        DOI: 10.1143/JJAP.51.035201 : PDF
総説・解説
      • 菅原康弘、李艶君
        “ケルビンプローブフォース顕微鏡とその薄膜成長評価への応用” : PDF
        顕微鏡、Vol.41, No.1, pp.18-21, 2012.

paper 2011

      1. Y. Kinoshita, Y. Naitoh, Y. J. Li and Y. Sugawara
        “Fabrication of Sharp Tungsten-coated Tip for Atomic Force Microscopy by Ion-beam Sputter deposition”
        Rev. Sci. Instrum., 82(11), (2011) 113707 (1-5).
        DOI: 10.1063/1.3663069 : PDF
      2. Y. Aburaya, H. Nomura, M. Kageshima, Y. Naitoh, Y. J. Li and Y. Sugawara
        “Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules”
        J. Appl. Phys., 109(6), (2011) 064308(1-8).
        DOI: 10.1063/1.3552926 : PDF
著書

paper 2010

      1. Y. Naitoh, Z. Ma, Y. J. Li, M. Kageshima and Y. Sugawara
        “Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy”
        J. Vac. Sci. & Technol. B, 28(6), (2010) 1210-1214.
        DOI: 10.1116/1.3503611 : PDF
      2. N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara
        “High force sensitivity in Q-controlled phase-modulation atomic force microscopy”
        Appl. Phys. Lett., 97(1), (2010) 011906-(1-3).
        DOI: 10.1063/1.3457431 : PDF
      3. T. Ogawa, S. Kurachi, M. Kageshima, Y. Naitoh, Y. J. Li and Y. Sugawara
        “Step Response Measurement of AFM Cantilever for Analysis of Frequency-Resolved Viscoelasticity”
        Ultramicroscopy , 110, (2010) 612-617.
        DOI: 10.1016/j.ultramic.2010.02.020 : PDF
      4. Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima and Y. Sugawara
        “Multifrequency High-Speed Phase-Modulation Atomic Force Microscopy in liquids”
        Ultramicroscopy , 110, (2010) 582-585.
        DOI: 10.1016/j.ultramic.2010.02.014 : PDF
      5. Y. Naitoh, Y. J. Li, H. Nomura, M. Kageshima and Y. Sugawara
        “Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5 K”
        J. Phys. Soc. Jpn., 79(1), (2010) 013601(1-4).
        DOI: 10.1143/JPSJ.79.013601 : PDF
著書
      • Y. Sugawara and Y. J. Li
        “Development of High-Speed Actuator for Scanning Probe Microscopy”
        Next Generation Actuators Leading Breakthroughs, eBook $149.00 (有料)
        Toshiro Higuchi, Koichi Suzumori, Satoshi Tadokoro Editors, Springer, 2010.
        Part II High Precision/Nano Actuators, Chapter 5, 45-54, (2010).

paper 2009

      1. Y. Naitoh, Y. Kinoshita, Y. J. Li, M. Kageshima and Y. Sugawara
        “The Influence of Si Cantilever Tip with/without Tungsten Coating on NC-AFM Imaging of Ge(001) Surface”
        Nanotechnology, 20, (2009) 264011(1-7).
        DOI: 10.1088/0957-4484/20/26/264011 : PDF
      2. M. Kageshima, T. Chikamoto, T. Ogawa, Y. Naitoh, Y. J. Li and Y. Sugawara
        “Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics”
        Rev. Sci. Instrum., 80(2), (2009) 023705(1-7).
        DOI: 10.1063/1.3080557 : PDF
査読付国際会議プロシーディングス
      1. Y. Kinoshita, Y. Kamimori, Y. Nakamura, T. Satoh, K. Tenjin, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara
        “Manipulation Mechanism of Single Cu Atoms on Cu(110)-O Surface with Dynamic Force Microscopy”
        Extended Abstract of 1st International Symposium on Atomically Controlled Fabrication Technology-Surface and Thin Film Processing,
        Feb. 16-17, Osaka University, Suita, Japan, 106-107 (2009).
      2. N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara
        “Local Potential Mapping Using Surface Photovoltage in Luquid”
        Extended Abstract of 1st International Symposium on Atomically Controlled Fabrication Technology-Surface and Thin Film Processing,
        Feb. 16-17, Osaka University, Suita, Japan, 130-131 (2009).
      3. Y. Sugawara, Y. J. Li, Y. Naitoh and M. Kageshima
        “Development of High-Speed Actuator for Scanning Probe Microscopy”
        Next Generation Actuators Leading Breakthroughs 1-3 (Springer, 2009).

paper 2008

      1. M. Kinoshita, Y. Naitoh, Y. J. Li, M. Kageshima and Y. Sugawara
        “Atomic-Scale Imaging of B/Si(111) √3x√3 Surface by Noncontact Atomic Force Microscopy”
        Jpn. J. Appl. Phys., 47(10B), (2008) 8218-8220.
        DOI: 10.1143/JJAP.47.8218 : PDF
      2. Y. J. Li, N. Kobayashi, H. Nomura, Y. Naitoh, M. Kageshima and Y. Sugawara
        “High-speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation”
        Jpn. J. Appl. Phys., 47(7B), (2008) 6121-6124.
        DOI: 10.1143/JJAP.47.6121 : PDF
      3. S. Kishimoto, M. Kageshima, Y. Naitoh, Y. J. Li and Y. Sugawara
        “Study of oxidized Cu(110) surface using noncontact atomic force microscopy”
        Surf. Sci., 602, (2008) 2175-2182.
        DOI: 10.1016/j.susc.2008.04.030 : PDF
      4. Y. J. Li, N. Kobayashi, Y. Naitoh, M. Kageshima and Y. Sugawara
        “Phase Modulation Atomic Force Microscopy (PM-AFM) in Constant Excitation Mode Capable of Simultaneous Imaging of Topography and Energy Dissipation”
        Appl. Phys. Lett., 92(12), (2008) 121903(1-3).
        DOI: 10.1063/1.2901151 : PDF
      5. N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara
        “Theoretical Investigation on Force Sensitivity in Q-Controlled Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode”
        J. Appl. Phys., 103(5), (2008) 054305 (1-4).
        DOI: 10.1063/1.2890380 : PDF
査読付国際会議プロシーディングス
      • Y. Sugawara, Y. J. Li, Y. Naitoh and M. Kageshima
        “Development of High-Speed Actuator for Scanning Probe Microscopy”
        Proceedings of the 2nd International Symposium on Next-Generation Actuators Leading Breakthrough,
        APA Hotel & Resort Tokyo Bay Makuhari, Chiba, Japan, April 17, 85-88 (2008).
総説・解説
      • 菅原 康弘、李艶君
        “「極低温環境における原子分解能非接触原子間力顕微鏡計測技術」” : PDF
        真空、第51巻第12号、pp.789-795, 2008.

paper 2007

      1. N. Kobayashi, Yanjun Li, Y. Naitoh, M. Kageshima, Y. Sugawara.
        “Improvement of the Sensitivity of Phase-Modulation Atomic Force Microscopy using Q-control Technique”
        Hyomen Kagaku 28(9), 532-535 (2007).
        DOI: 10.1380/jsssj.28.532
      2. Y. Sugawara, N. Kobayashi, M. Kawakami, Y. J. Li, Y. Naitoh and M. Kageshima
        “Elimination of instabilities in phase shift curves in phase-modulation atomic force microscopy in constant-amplitude mode”
        Appl. Phys. Lett., 90(19), (2007) 194104 (1-3).
        DOI: 10.1063/1.2737907 : PDF
      3. 小林成貴、李艶君、内藤賀公、影島賢巳、菅原康弘
        “Q値制御法による位相変調様式原子間力顕微鏡の感度向上” : PDF
        表面科学, 28(8), （2007） 532-535.
      4. Y. Naitoh, K. Momotani, H. Nomura, Y. J. Li, M. Kageshima and Y. Sugawara
        “Force Microscopy Imaging of Rest Atom on Si(111)7×7 Surface under strong Tip-Surface Interaction”
        J. Phys. Soc. Jpn., 76(3), (2007) 033601 (1-4).
        DOI: 10.1143/JPSJ.76.033601 : PDF
      5. H. Nomura, K. Kawasaki, T. Chikamoto, Y. J. Li, Y. Naitoh, M. Kageshima and Y.Sugawara
        “Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage”
        Appl. Phys. Lett., 90(3), (2007) 033118 (1-3).
        DOI: 10.1063/1.2432281 : PDF
      6. 内藤賀公, 野村光, 影島賢巳, 李艶君, 菅原康弘
        “Si(001) ステップからの表面応力によるダイマー構造変化のLT-NC-AFM測定” : PDF
        表面科学, 28（8）, (2007) 421-427.
査読付国際会議プロシーディングス
      • Y. Sugawara, Y. J. Li, Y. Naitoh and M. Kageshima
        “Development of High-Speed Actuator for Scanning Probe Microscopy”
        Proceedings of the 4th Symposium on Next-Generation Actuators Leading Breakthroughs, Okinawa Convention Center, Okinawa, Japan, November 19-20,
        23-26 (2007).

paper 2006

      1. Y. J. Li, H. Nomura, N. Ozaki, Y. Naitoh, M. Kageshima and Y. Sugawara, Chris Hobbs and Lev Kantorovich
        “Origin of p(2×1) phase on Si(001) by Noncontact Atomic Force Microscopy at 5K”
        Phys. Rev. Lett., 96(10), (2006) 106104 (1-4).
        DOI: 10.1103/PhysRevLett.96.106104 : PDF
      2. Y. Sugawara, K. Kawasaki, Y. J. Li, Y. Naitoh and M. Kageshima
        “Identification of Subsurface Atom Species Using Noncontact AFM”
        Modern Scientic Instruments, 2006 Supplement, (2006) 18-19.
      3. Y. J. Li, H. Nomura, N. Ozaki, Y. Naitoh, M. Kageshima and Y. Sugawara
        “The tip-induced surface structure change on Si(001) surface by NC-AFM at 5K”
        Modern Scientic Instruments, 2006 Supplement, (2006) 40-41.
      4. M. Kageshima, S. Togo, Y. J. Li, Y. Naitoh and Y. Sugawara
        “Wideband and hysteresis-free regulation of piezoelectric actuator based on induced current for high-speed scanning probe microscopy”
        Rev. Sci. Instrum., 77(10), (2006) 103701(1-6).
        DOI: 10.1063/1.2356850 : PDF
      5. N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara
        “High-Sensitivity Force Detection by Phase-Modulation Atomic Force Microscopy”
        Jpn. J. Appl. Phys., 45(30), (2006) 793-795.
        DOI: 10.1143/JJAP.45.L793 : PDF
査読付国際会議プロシーディングス
      1. Y. Sugawara, K. Kawasaki, Y. J. Li, Y. Naitoh and M. Kageshima
        “Identification of Subsurface Atom Species Using Noncontact AFM”
        Modern Scientic Instruments 18-19 Supplement，2006.
      2. Y. J. Li, H. Nomura, N. Ozaki, Y. Naitoh, M. Kageshima and Y. Sugawara
        “The tip-induced surface structure change on Si(001) surface by NC-AFM at 5K”
        Modern Scientic Instruments 40-41 Supplement，2006.

paper 2005

      1. M. Komiyama and Y. J. Li
        “Photoresponse of surface oxygen defects on TiO2(110)”
        Appl. Surf. Sci., 244, (2005) 550-553.
        DOI: 10.1016/j.apsusc.2004.10.117 : PDF

paper 2004

      1. Masaharu Komiyama, Kohei Kiyohara, Yanjun Li, Takashi Fujikawa, Takeshi Ebihara, Takeshi Kubota, Yasuaki Okamoto.
        “Crater structures on a molybdenite basal plane observed by　ultra-high vacuum scanning tunneling microscopy and　its implication to hydrotreating”
        Journal of Molecular Catalysis A: Chemical 215, 143–147 (2004).
      2. M. Komiyama, Y. J. Li and N. Gu
        “In situ observations of tetraamineplatinum(II) hydroxide adsorption from its aqueous solution on heulandite (010) surface by atomic force microscopy”
        Appl. Surf. Sci., 237, (2004) 503-508.
        DOI: 10.1016/j.apsusc.2004.06.114 : PDF
      3. Y. J. Li, T. Matsumoto, N. Gu and M. Komiyama
        “Local structural change caused by light irradiation on TiO2 (110) surface observed by scanning tunneling microscopy”
        Appl. Surf. Sci. 237, (2004) 374-379.
        DOI: 10.1016/j.apsusc.2004.06.140 : PDF
      4. R. Tero, M. Takizawa, Y. J. Li, M. Yamazaki and T. Urisu
        “Lipid membrane formation by vesicle fusion on silicon dioxide surfaces modified with alkyl Self-Assembled monolayer islands”
        Langmular, 20(18), (2004) 7526-7531.
        DOI: 10.1021/la0400306 : PDF
      5. M. Komiyama and Y. J. Li
        “Photoresponse of Titanium dioxide Surface on Atomic Scale: Site for Visible Light Absorption”
        Jpn. J. Apples. Phys., 43(7B), (2004) 4584-4587.
        DOI: 10.1143/JJAP.43.4584 : PDF
      6. R. Tero, M. Takizawa, Y. J. Li and T. Urisu
        “Deposition of phospholipid layers on SiO2 surface modified by alkyl-SAM islands”
        Appl. Surf. Sci., 238, (2004) 218-222.
        DOI: 10.1016/j.apsusc.2004.05.203 : PDF
      7. Y. J. Li, R. Tero, T. Nagasawa, T Nagata and T. Urisu
        “Deposition of 10-undecenoic acid Self-Assembled layers on H-Si(111) Surfaces studied by AFM and FT-IR”
        Appl. Surf. Sci., 238, (2004) 238-241.
        DOI: 10.1016/j.apsusc.2004.05.233 : PDF
      8. Y. J. Li, R. Tero, T. Nagasawa, T Nagata and T. Urisu
        “Structure and Deposition Mechanism of 10-Undecenoic Acid Self-assembled Layers on H-Si (111) Surfaces Studied by AFM and FT-IR”
        Jpn. J. Appl. Phys., 43(7B), (2004) 4591-4594.
        DOI: 10.1143/JJAP.43.4591 : PDF

paper 2003

      1. Y. J. Li, O. Takeuchi, D. N. Futaba, K. Miyake and H. Shigekawa Y. Kuk
        “Charateristic intra- and interunit interactions of the Kr atoms adsorbed on Si(111)-7×7 surface”
        Phys. Rev. B 68, (2003) 033301-(1-4).
        DOI: 10.1103/PhysRevB.68.033301 : PDF
      2. Y. J. Li, O. Takeuchi, D. N. Futaba, K. Miyake, H. Shigekawa, Y. Kuk and T. Urisu
        “The Influences of Tip Scan and Tunneling Current by Adsorbing Kr on a Si (111)-7×7 Surface at Low Temperature”
        AIP Conference Proceedings 696, (2003) 818-822 : PDF file is 7MB and is restricted
      3. M. Komiyama, D. Yin and Y. J. Li
        “Electronic Structure Change on TiO2 Surface due to UV light Irradiation”
        Stud. Surf. Sci. Catal., 45, (2003) 153-156 : PDF file can be purchased (有料)

paper 2002

      1. Y. J. Li, O. Takeuchi, D. N. Futaba, K. Miyake and H. Shigekawa Y. Kuk
        “Characteristic adsorption of Xe on a Si (111)-7×7 surface at low temperature”
        Phys. Rev. B 65, (2002) 113306-(1-4).
        DOI: 10.1103/PhysRevB.65.113306 : PDF
      2. M. Komiyama, Y. J. Li and D. Yin
        “Apparent Local Structural Change Caused by Ultraviolet Light on a TiO2 Surface Observed by Scanning Tunneling Microscopy”,
        J. Appl. Phys., 41(7B), (2002) 4936-4938 : PDF

paper 2001

      1. Y. J. Li, M. Matsumoto, K. Miyake, O. Takeuchi and H. Shigekawa
        “Adsorption and Wetting Structures of Kr on Pt (111) at 8K and 45K Studied by Scanning Tunneling Microscopy”
        Jpn. J. Appl. Phys., 40(6B), (2001) 4399-4402 : PDF

paper 2000

      1. T. Kaikoh, K. Miyake, Y. J. Li, R. Morita, M. Yamashita and H. Shigekawa
        “Site Preferences of Oxygen and Boron Atoms during Dissociative Reaction of HBO2 Molecules onto the Si (111)-7×7 Surfaces”
        J. Vac. Sci. Technol. A, 18(4), (2000) 1469-1472 : PDF

paper 1999

      1. K. Miyake, T. Kaikoh, Y. J. Li, H. Oigawa and H. Shigekawa
        “Si(111) Surface Under Phase Transitions Studied by the Analysis of Inner Layer Structures Using Bias-dependent Scanning Tunneling Microscopy”
        Jpn. J. Appl. Phys., 38(6B), (1999) 3841-3844 : PDF
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